Measurement of Thermooptic Coefficient in Lead Sulfide Using Laser Single-Beam Scanning Technique

In this work, the single beam scanning technique was employed to expressthe nonlinear interaction between laser radiation and semiconductor material(lead sulfide) as well as to determine the thermooptic coefficient of thematerial (lead sulfide). Direct measurement, low cost and reliability are thema...

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Main Authors: Ban Bader, Oday Hamadi, K. Afnan
Format: Article
Language:English
Published: Unviversity of Technology- Iraq 2007-05-01
Series:Engineering and Technology Journal
Online Access:https://etj.uotechnology.edu.iq/article_181332_d30017f6fee70a6c75efd95cd47ef4a9.pdf
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author Ban Bader
Oday Hamadi
K. Afnan
author_facet Ban Bader
Oday Hamadi
K. Afnan
author_sort Ban Bader
collection DOAJ
description In this work, the single beam scanning technique was employed to expressthe nonlinear interaction between laser radiation and semiconductor material(lead sulfide) as well as to determine the thermooptic coefficient of thematerial (lead sulfide). Direct measurement, low cost and reliability are themain features of this technique. The value of the thermooptic coefficient wasdetermined to be -5.8x10-5K-1 for PbS thin film. Due to authors review, this isthe first attempt in Iraq to measure such parameter in semiconductor thinfilms.
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spelling doaj.art-bdaa61a4a7ee422a9971c4ff1ee3aff32024-02-04T17:54:49ZengUnviversity of Technology- IraqEngineering and Technology Journal1681-69002412-07582007-05-0125568368910.30684/etj.25.5.8181332Measurement of Thermooptic Coefficient in Lead Sulfide Using Laser Single-Beam Scanning TechniqueBan BaderOday HamadiK. AfnanIn this work, the single beam scanning technique was employed to expressthe nonlinear interaction between laser radiation and semiconductor material(lead sulfide) as well as to determine the thermooptic coefficient of thematerial (lead sulfide). Direct measurement, low cost and reliability are themain features of this technique. The value of the thermooptic coefficient wasdetermined to be -5.8x10-5K-1 for PbS thin film. Due to authors review, this isthe first attempt in Iraq to measure such parameter in semiconductor thinfilms.https://etj.uotechnology.edu.iq/article_181332_d30017f6fee70a6c75efd95cd47ef4a9.pdf
spellingShingle Ban Bader
Oday Hamadi
K. Afnan
Measurement of Thermooptic Coefficient in Lead Sulfide Using Laser Single-Beam Scanning Technique
Engineering and Technology Journal
title Measurement of Thermooptic Coefficient in Lead Sulfide Using Laser Single-Beam Scanning Technique
title_full Measurement of Thermooptic Coefficient in Lead Sulfide Using Laser Single-Beam Scanning Technique
title_fullStr Measurement of Thermooptic Coefficient in Lead Sulfide Using Laser Single-Beam Scanning Technique
title_full_unstemmed Measurement of Thermooptic Coefficient in Lead Sulfide Using Laser Single-Beam Scanning Technique
title_short Measurement of Thermooptic Coefficient in Lead Sulfide Using Laser Single-Beam Scanning Technique
title_sort measurement of thermooptic coefficient in lead sulfide using laser single beam scanning technique
url https://etj.uotechnology.edu.iq/article_181332_d30017f6fee70a6c75efd95cd47ef4a9.pdf
work_keys_str_mv AT banbader measurementofthermoopticcoefficientinleadsulfideusinglasersinglebeamscanningtechnique
AT odayhamadi measurementofthermoopticcoefficientinleadsulfideusinglasersinglebeamscanningtechnique
AT kafnan measurementofthermoopticcoefficientinleadsulfideusinglasersinglebeamscanningtechnique