Equivalent Electromechanical Model for Quartz Tuning Fork Used in Atomic Force Microscopy

Equivalent Electromechanical Model for Quartz Tuning Fork Used in Atomic Force Microscopy

Quartz tuning forks (QTFs) are self-sensing and possess a high quality factor, allowing them to be used as probes for atomic force microscopes (AFMs) for which they offer nano-scale resolution of sample images. Since recent work has revealed that utilizing higher-order modes of QTFs can offer better...

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Bibliographic Details
Main Authors: Rui Lin, Jianqiang Qian, Yingzi Li, Peng Cheng, Cheng Wang, Lei Li, Xiaodong Gao, Wendong Sun
Format: Article
Language:English
Published: MDPI AG 2023-04-01
Series:Sensors
Subjects:
atomic force microscope
quartz tuning fork
higher eigenmode
electromechanical model
Online Access:https://www.mdpi.com/1424-8220/23/8/3923

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