DeepFocus: fast focus and astigmatism correction for electron microscopy
Abstract High-throughput 2D and 3D scanning electron microscopy, which relies on automation and dependable control algorithms, requires high image quality with minimal human intervention. Classical focus and astigmatism correction algorithms attempt to explicitly model image formation and subsequent...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
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Nature Portfolio
2024-01-01
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| Series: | Nature Communications |
| Online Access: | https://doi.org/10.1038/s41467-024-45042-3 |
| _version_ | 1797274053411602432 |
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| author | P. J. Schubert R. Saxena J. Kornfeld |
| author_facet | P. J. Schubert R. Saxena J. Kornfeld |
| author_sort | P. J. Schubert |
| collection | DOAJ |
| description | Abstract High-throughput 2D and 3D scanning electron microscopy, which relies on automation and dependable control algorithms, requires high image quality with minimal human intervention. Classical focus and astigmatism correction algorithms attempt to explicitly model image formation and subsequently aberration correction. Such models often require parameter adjustments by experts when deployed to new microscopes, challenging samples, or imaging conditions to prevent unstable convergence, making them hard to use in practice or unreliable. Here, we introduce DeepFocus, a purely data-driven method for aberration correction in scanning electron microscopy. DeepFocus works under very low signal-to-noise ratio conditions, reduces processing times by more than an order of magnitude compared to the state-of-the-art method, rapidly converges within a large aberration range, and is easily recalibrated to different microscopes or challenging samples. |
| first_indexed | 2024-03-07T14:52:53Z |
| format | Article |
| id | doaj.art-bea499603ae242b8932d996abb2ba0f8 |
| institution | Directory Open Access Journal |
| issn | 2041-1723 |
| language | English |
| last_indexed | 2024-03-07T14:52:53Z |
| publishDate | 2024-01-01 |
| publisher | Nature Portfolio |
| record_format | Article |
| series | Nature Communications |
| spelling | doaj.art-bea499603ae242b8932d996abb2ba0f82024-03-05T19:37:14ZengNature PortfolioNature Communications2041-17232024-01-0115111010.1038/s41467-024-45042-3DeepFocus: fast focus and astigmatism correction for electron microscopyP. J. Schubert0R. Saxena1J. Kornfeld2Max Planck Institute for Biological IntelligenceMax Planck Institute for Biological IntelligenceMax Planck Institute for Biological IntelligenceAbstract High-throughput 2D and 3D scanning electron microscopy, which relies on automation and dependable control algorithms, requires high image quality with minimal human intervention. Classical focus and astigmatism correction algorithms attempt to explicitly model image formation and subsequently aberration correction. Such models often require parameter adjustments by experts when deployed to new microscopes, challenging samples, or imaging conditions to prevent unstable convergence, making them hard to use in practice or unreliable. Here, we introduce DeepFocus, a purely data-driven method for aberration correction in scanning electron microscopy. DeepFocus works under very low signal-to-noise ratio conditions, reduces processing times by more than an order of magnitude compared to the state-of-the-art method, rapidly converges within a large aberration range, and is easily recalibrated to different microscopes or challenging samples.https://doi.org/10.1038/s41467-024-45042-3 |
| spellingShingle | P. J. Schubert R. Saxena J. Kornfeld DeepFocus: fast focus and astigmatism correction for electron microscopy Nature Communications |
| title | DeepFocus: fast focus and astigmatism correction for electron microscopy |
| title_full | DeepFocus: fast focus and astigmatism correction for electron microscopy |
| title_fullStr | DeepFocus: fast focus and astigmatism correction for electron microscopy |
| title_full_unstemmed | DeepFocus: fast focus and astigmatism correction for electron microscopy |
| title_short | DeepFocus: fast focus and astigmatism correction for electron microscopy |
| title_sort | deepfocus fast focus and astigmatism correction for electron microscopy |
| url | https://doi.org/10.1038/s41467-024-45042-3 |
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