Two-Photon Optical Beam-Induced Current Microscopy of Light-Emitting Diodes
We demonstrate two-photon optical beam-induced current (2P-OBIC) microscopy of light-emitting diodes (LEDs). We utilized a Ti:Sapphire femtosecond laser source operating at 800 nm to derive the 2P-OBIC signal from a 605 nm band-gap LED. The spatial confinement of free carrier generation only at the...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
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University of the Philippines
2004-12-01
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| Series: | Science Diliman |
| Subjects: | |
| Online Access: | http://journals.upd.edu.ph/index.php/sciencediliman/article/view/108 |
| _version_ | 1818695788269666304 |
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| author | Godofredo Bautista Jr. Carlo Mar Blanca Caesar Saloma |
| author_facet | Godofredo Bautista Jr. Carlo Mar Blanca Caesar Saloma |
| author_sort | Godofredo Bautista Jr. |
| collection | DOAJ |
| description | We demonstrate two-photon optical beam-induced current (2P-OBIC) microscopy of light-emitting diodes (LEDs). We utilized a Ti:Sapphire femtosecond laser source operating at 800 nm to derive the 2P-OBIC signal from a 605 nm band-gap LED. The spatial confinement of free carrier generation only at the focus and the quadratic dependence of the 2P-OBIC signal on excitation power are the key principles in two-photon excitation. As a consequence, superior image quality evident in the 2P-OBIC images of LEDs are obtained. These features decrease the linear absorption and wide-angle scattering effects plaguing single-photon optical beam-induced current (1P-OBIC) technique, thereby increasing the resolution of the imaging system in the axial and lateral directions. Thus, the attainment of good axial discrimination in the LED samples is obtained even without a confocal pinhole. In addition, 2P-OBIC images reveal local variations in free carrier densities which are not evident in the single-photon excitation. |
| first_indexed | 2024-12-17T13:51:02Z |
| format | Article |
| id | doaj.art-becf6f0c05e44a7a9ea5a994bdc64dec |
| institution | Directory Open Access Journal |
| issn | 0115-7809 2012-0818 |
| language | English |
| last_indexed | 2024-12-17T13:51:02Z |
| publishDate | 2004-12-01 |
| publisher | University of the Philippines |
| record_format | Article |
| series | Science Diliman |
| spelling | doaj.art-becf6f0c05e44a7a9ea5a994bdc64dec2022-12-21T21:46:02ZengUniversity of the PhilippinesScience Diliman0115-78092012-08182004-12-011626165Two-Photon Optical Beam-Induced Current Microscopy of Light-Emitting DiodesGodofredo Bautista Jr.Carlo Mar BlancaCaesar SalomaWe demonstrate two-photon optical beam-induced current (2P-OBIC) microscopy of light-emitting diodes (LEDs). We utilized a Ti:Sapphire femtosecond laser source operating at 800 nm to derive the 2P-OBIC signal from a 605 nm band-gap LED. The spatial confinement of free carrier generation only at the focus and the quadratic dependence of the 2P-OBIC signal on excitation power are the key principles in two-photon excitation. As a consequence, superior image quality evident in the 2P-OBIC images of LEDs are obtained. These features decrease the linear absorption and wide-angle scattering effects plaguing single-photon optical beam-induced current (1P-OBIC) technique, thereby increasing the resolution of the imaging system in the axial and lateral directions. Thus, the attainment of good axial discrimination in the LED samples is obtained even without a confocal pinhole. In addition, 2P-OBIC images reveal local variations in free carrier densities which are not evident in the single-photon excitation.http://journals.upd.edu.ph/index.php/sciencediliman/article/view/108two-photon optical beam-induced current2P-OBICLight-Emitting Diodes |
| spellingShingle | Godofredo Bautista Jr. Carlo Mar Blanca Caesar Saloma Two-Photon Optical Beam-Induced Current Microscopy of Light-Emitting Diodes Science Diliman two-photon optical beam-induced current 2P-OBIC Light-Emitting Diodes |
| title | Two-Photon Optical Beam-Induced Current Microscopy of Light-Emitting Diodes |
| title_full | Two-Photon Optical Beam-Induced Current Microscopy of Light-Emitting Diodes |
| title_fullStr | Two-Photon Optical Beam-Induced Current Microscopy of Light-Emitting Diodes |
| title_full_unstemmed | Two-Photon Optical Beam-Induced Current Microscopy of Light-Emitting Diodes |
| title_short | Two-Photon Optical Beam-Induced Current Microscopy of Light-Emitting Diodes |
| title_sort | two photon optical beam induced current microscopy of light emitting diodes |
| topic | two-photon optical beam-induced current 2P-OBIC Light-Emitting Diodes |
| url | http://journals.upd.edu.ph/index.php/sciencediliman/article/view/108 |
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