Control of the Longitudinal Compression and Transverse Focus of Ultrafast Electron Beam for Detecting the Transient Evolution of Materials
Ultrafast detection is an effective method to reveal the transient evolution mechanism of materials. Compared with ultra-fast X-ray diffraction (XRD), the ultra-fast electron beam is increasingly adopted because the larger scattering cross-section is less harmful to the sample. The keV single-shot u...
Main Authors: | Xintian Cai, Zhen Wang, Chaoyue Ji, Xuan Wang, Zhiyin Gan, Sheng Liu |
---|---|
Format: | Article |
Language: | English |
Published: |
MDPI AG
2022-01-01
|
Series: | Materials |
Subjects: | |
Online Access: | https://www.mdpi.com/1996-1944/15/2/571 |
Similar Items
-
Transient Responses of Repeated Transverse Impacts on Beams
by: Hui Wang, et al.
Published: (2023-01-01) -
Transient analysis of transversely functionally graded Timoshenko beam (TFGTB) in conjunction with finite element method
by: Salwan Obaid Waheed Khafaji, et al.
Published: (2020-08-01) -
Verification of SARAX code system in the reactor core transient calculation based on the simplified EBR-II benchmark
by: Xiaoqian Jia, et al.
Published: (2022-05-01) -
A Comprehensive Review on Transient Recovery Voltage in Power Systems: Models, Standardizations and Analysis
by: Eleonora Fripp Lazzari, et al.
Published: (2023-09-01) -
Ultrafast multi-target control of tightly focused light fields
by: Yanxiang Zhang, et al.
Published: (2022-03-01)