| Summary: | The mid-infrared absorber is an important device for effective capture of high by atmospheric infrared transparent window, and has been a research hotspot in military, medical, biological and other fields. In this paper, a kind of ultra-thin mid-infrared ultra-broadband absorber with background insensitive is realized by stacking four metal/dielectric films (Si/Ag/Si<sub>3</sub>N<sub>4</sub>/SiO<sub>2</sub>) on silver substrate and periodically arranged cross-anchor metal pattern in a method of finite-difference time domain. The results show that the absorption rate is more than 90% and the relative absorption bandwidth is 95.5% in the wavelength ranging from 9.1 μm to 24.1 μm. The average absorptivity is 92% in the range of background refractive index (<italic>n</italic> = 1∼1.8), A proof of the device's insensibility to background refractive index. At a large incidence angle (θ ≤ 50°), the lowest absorption rate is up to 80%. The thickness of the optimized device is only 1.7 μm. The research results have important application value in infrared remote sensing, pollution monitoring, disease diagnosis and other fields.
|
|---|