Multichannel Online Lifetime Accelerating and Testing System for Power Light-Emitting Diodes
The accelerated life testing is a common tool to achieve lifetime prediction and reliability analysis for light-emitting diodes (LEDs). Currently, all popular accelerated methods, either offline or online, employ a large volume, energy-consuming temperature chamber, which will cause the instruments...
Main Authors: | Jingjing Xiao, Ziquan Guo, Yao Xiao, Yulin Gao, Lihong Zhu, Yue Lin, Yijun Lu, Zhong Chen |
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Format: | Article |
Language: | English |
Published: |
IEEE
2017-01-01
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Series: | IEEE Photonics Journal |
Subjects: | |
Online Access: | https://ieeexplore.ieee.org/document/7894192/ |
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