Growth and characterization of textured well-faceted ZnO on planar Si(100), planar Si(111), and textured Si(100) substrates for solar cell applications
In this work, textured, well-faceted ZnO materials grown on planar Si(100), planar Si(111), and textured Si(100) substrates by low-pressure chemical vapor deposition (LPCVD) were analyzed by X-ray diffraction (XRD), scanning electron microscopy (SEM), atomic force microscopy (AFM), and cathode lumin...
Auteurs principaux: | , , , , , , , |
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Format: | Article |
Langue: | English |
Publié: |
Beilstein-Institut
2017-09-01
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Collection: | Beilstein Journal of Nanotechnology |
Sujets: | |
Accès en ligne: | https://doi.org/10.3762/bjnano.8.194 |