Growth and characterization of textured well-faceted ZnO on planar Si(100), planar Si(111), and textured Si(100) substrates for solar cell applications

In this work, textured, well-faceted ZnO materials grown on planar Si(100), planar Si(111), and textured Si(100) substrates by low-pressure chemical vapor deposition (LPCVD) were analyzed by X-ray diffraction (XRD), scanning electron microscopy (SEM), atomic force microscopy (AFM), and cathode lumin...

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Détails bibliographiques
Auteurs principaux: Chin-Yi Tsai, Jyong-Di Lai, Shih-Wei Feng, Chien-Jung Huang, Chien-Hsun Chen, Fann-Wei Yang, Hsiang-Chen Wang, Li-Wei Tu
Format: Article
Langue:English
Publié: Beilstein-Institut 2017-09-01
Collection:Beilstein Journal of Nanotechnology
Sujets:
Accès en ligne:https://doi.org/10.3762/bjnano.8.194