Structural, morphology and electrical properties of layered copper selenide thin film
| Main Authors: | , , , , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
De Gruyter
2009-06-01
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| Series: | Open Physics |
| Subjects: | |
| Online Access: | https://doi.org/10.2478/s11534-009-0057-1 |
| _version_ | 1818586162767331328 |
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| author | Ying Chyi Liew J. Talib Zainal Mahmood W. Yunus M. Zainal Zulkarnain Halim Shaari Moksin Mohd Yusoff Wan Pah Lim K. |
| author_facet | Ying Chyi Liew J. Talib Zainal Mahmood W. Yunus M. Zainal Zulkarnain Halim Shaari Moksin Mohd Yusoff Wan Pah Lim K. |
| author_sort | Ying Chyi Liew J. |
| collection | DOAJ |
| first_indexed | 2024-12-16T08:48:35Z |
| format | Article |
| id | doaj.art-c00f3c8cbb1a4db88754a6680cef859d |
| institution | Directory Open Access Journal |
| issn | 2391-5471 |
| language | English |
| last_indexed | 2024-12-16T08:48:35Z |
| publishDate | 2009-06-01 |
| publisher | De Gruyter |
| record_format | Article |
| series | Open Physics |
| spelling | doaj.art-c00f3c8cbb1a4db88754a6680cef859d2022-12-21T22:37:32ZengDe GruyterOpen Physics2391-54712009-06-017237938410.2478/s11534-009-0057-1Structural, morphology and electrical properties of layered copper selenide thin filmYing Chyi Liew J.0Talib Zainal1Mahmood W.2Yunus M.3Zainal Zulkarnain4Halim Shaari5Moksin Mohd6Yusoff Wan7Pah Lim K.8Faculty of Science, Universiti Putra Malaysia, 43400 UPM, Serdang, MalaysiaFaculty of Science, Universiti Putra Malaysia, 43400 UPM, Serdang, MalaysiaFaculty of Science, Universiti Putra Malaysia, 43400 UPM, Serdang, MalaysiaFaculty of Science, Universiti Putra Malaysia, 43400 UPM, Serdang, MalaysiaFaculty of Science, Universiti Putra Malaysia, 43400 UPM, Serdang, MalaysiaFaculty of Science, Universiti Putra Malaysia, 43400 UPM, Serdang, MalaysiaFaculty of Science, Universiti Putra Malaysia, 43400 UPM, Serdang, MalaysiaFaculty of Science, Universiti Putra Malaysia, 43400 UPM, Serdang, MalaysiaFaculty of Science, Universiti Putra Malaysia, 43400 UPM, Serdang, Malaysiahttps://doi.org/10.2478/s11534-009-0057-1cuse thin filmselectrical conductivitysurface roughnessfilm thicknessgrain size71.20.nr72.20.-i73.21.ac73.25.+i73.50.-h |
| spellingShingle | Ying Chyi Liew J. Talib Zainal Mahmood W. Yunus M. Zainal Zulkarnain Halim Shaari Moksin Mohd Yusoff Wan Pah Lim K. Structural, morphology and electrical properties of layered copper selenide thin film Open Physics cuse thin films electrical conductivity surface roughness film thickness grain size 71.20.nr 72.20.-i 73.21.ac 73.25.+i 73.50.-h |
| title | Structural, morphology and electrical properties of layered copper selenide thin film |
| title_full | Structural, morphology and electrical properties of layered copper selenide thin film |
| title_fullStr | Structural, morphology and electrical properties of layered copper selenide thin film |
| title_full_unstemmed | Structural, morphology and electrical properties of layered copper selenide thin film |
| title_short | Structural, morphology and electrical properties of layered copper selenide thin film |
| title_sort | structural morphology and electrical properties of layered copper selenide thin film |
| topic | cuse thin films electrical conductivity surface roughness film thickness grain size 71.20.nr 72.20.-i 73.21.ac 73.25.+i 73.50.-h |
| url | https://doi.org/10.2478/s11534-009-0057-1 |
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