High-resolution hard-x-ray photoelectron diffraction in a momentum microscope—the model case of graphite

High-resolution hard-x-ray photoelectron diffraction in a momentum microscope—the model case of graphite

Hard x-ray photoelectron diffraction (hXPD) patterns recorded with a momentum microscope with high k -resolution (0.025 Å ^−1 equivalent to an angular resolution of 0.034° at 7 keV) reveal unprecedented rich fine structure. We have studied hXPD of the C 1s core level in the prototypical low-Z materi...

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Bibliographic Details
Main Authors: O Fedchenko, A Winkelmann, K Medjanik, S Babenkov, D Vasilyev, S Chernov, C Schlueter, A Gloskovskii, Yu Matveyev, W Drube, B Schönhense, H J Elmers, G Schönhense
Format: Article
Language:English
Published: IOP Publishing 2019-01-01
Series:New Journal of Physics
Subjects:
photoemission
hard x-rays
photoelectron diffraction
graphite
time-of-flight (ToF) momentum microscopy
Online Access:https://doi.org/10.1088/1367-2630/ab51fe

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