Spectroscopic ellipsometry for low-dimensional materials and heterostructures
Discovery of low-dimensional materials has been of great interest in physics and material science. Optical permittivity is an optical fingerprint of material electronic structures, and thus it is an important parameter in the study of the properties of materials. Spectroscopic ellipsometry provides...
| Main Authors: | , |
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| Format: | Article |
| Language: | English |
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De Gruyter
2022-04-01
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| Series: | Nanophotonics |
| Subjects: | |
| Online Access: | https://doi.org/10.1515/nanoph-2022-0039 |
| _version_ | 1797947918726987776 |
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| author | Yoo SeokJae Park Q-Han |
| author_facet | Yoo SeokJae Park Q-Han |
| author_sort | Yoo SeokJae |
| collection | DOAJ |
| description | Discovery of low-dimensional materials has been of great interest in physics and material science. Optical permittivity is an optical fingerprint of material electronic structures, and thus it is an important parameter in the study of the properties of materials. Spectroscopic ellipsometry provides a fast, robust, and noninvasive method for obtaining the optical permittivity spectra of newly discovered materials. Atomically thin low-dimensional materials have an extremely short vertical optical path length inside them, making the spectroscopic ellipsometry of low-dimensional materials unique, compared to traditional ellipsometry. Here, we introduce the fundamentals of spectroscopic ellipsometry for two-dimensional (2D) materials and review recent progress. We also discuss technical challenges and future directions in spectroscopic ellipsometry for low-dimensional materials. |
| first_indexed | 2024-04-10T21:35:16Z |
| format | Article |
| id | doaj.art-c02f323d09ba47b784345940d2ec9529 |
| institution | Directory Open Access Journal |
| issn | 2192-8606 2192-8614 |
| language | English |
| last_indexed | 2024-04-10T21:35:16Z |
| publishDate | 2022-04-01 |
| publisher | De Gruyter |
| record_format | Article |
| series | Nanophotonics |
| spelling | doaj.art-c02f323d09ba47b784345940d2ec95292023-01-19T12:47:00ZengDe GruyterNanophotonics2192-86062192-86142022-04-0111122811282510.1515/nanoph-2022-0039Spectroscopic ellipsometry for low-dimensional materials and heterostructuresYoo SeokJae0Park Q-Han1Department of Physics, Inha University, Incheon22212, KoreaDepartment of Physics, Korea University, Seoul02841, KoreaDiscovery of low-dimensional materials has been of great interest in physics and material science. Optical permittivity is an optical fingerprint of material electronic structures, and thus it is an important parameter in the study of the properties of materials. Spectroscopic ellipsometry provides a fast, robust, and noninvasive method for obtaining the optical permittivity spectra of newly discovered materials. Atomically thin low-dimensional materials have an extremely short vertical optical path length inside them, making the spectroscopic ellipsometry of low-dimensional materials unique, compared to traditional ellipsometry. Here, we introduce the fundamentals of spectroscopic ellipsometry for two-dimensional (2D) materials and review recent progress. We also discuss technical challenges and future directions in spectroscopic ellipsometry for low-dimensional materials.https://doi.org/10.1515/nanoph-2022-0039electronic structuresellipsometrylow dimensional materialspermittivityspectroscopyvan der waals materials |
| spellingShingle | Yoo SeokJae Park Q-Han Spectroscopic ellipsometry for low-dimensional materials and heterostructures Nanophotonics electronic structures ellipsometry low dimensional materials permittivity spectroscopy van der waals materials |
| title | Spectroscopic ellipsometry for low-dimensional materials and heterostructures |
| title_full | Spectroscopic ellipsometry for low-dimensional materials and heterostructures |
| title_fullStr | Spectroscopic ellipsometry for low-dimensional materials and heterostructures |
| title_full_unstemmed | Spectroscopic ellipsometry for low-dimensional materials and heterostructures |
| title_short | Spectroscopic ellipsometry for low-dimensional materials and heterostructures |
| title_sort | spectroscopic ellipsometry for low dimensional materials and heterostructures |
| topic | electronic structures ellipsometry low dimensional materials permittivity spectroscopy van der waals materials |
| url | https://doi.org/10.1515/nanoph-2022-0039 |
| work_keys_str_mv | AT yooseokjae spectroscopicellipsometryforlowdimensionalmaterialsandheterostructures AT parkqhan spectroscopicellipsometryforlowdimensionalmaterialsandheterostructures |