Spectroscopic ellipsometry for low-dimensional materials and heterostructures

Discovery of low-dimensional materials has been of great interest in physics and material science. Optical permittivity is an optical fingerprint of material electronic structures, and thus it is an important parameter in the study of the properties of materials. Spectroscopic ellipsometry provides...

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Bibliographic Details
Main Authors: Yoo SeokJae, Park Q-Han
Format: Article
Language:English
Published: De Gruyter 2022-04-01
Series:Nanophotonics
Subjects:
Online Access:https://doi.org/10.1515/nanoph-2022-0039