A randomized benchmarking suite for mid-circuit measurements

Mid-circuit measurements are a key component in many quantum information computing protocols, including quantum error correction, fault-tolerant logical operations, and measurement based quantum computing. As such, techniques to quickly and efficiently characterize or benchmark their performance are...

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Bibliographic Details
Main Authors: L C G Govia, P Jurcevic, C J Wood, N Kanazawa, S T Merkel, D C McKay
Format: Article
Language:English
Published: IOP Publishing 2023-01-01
Series:New Journal of Physics
Subjects:
Online Access:https://doi.org/10.1088/1367-2630/ad0e19