Cheng, Q., Rajauria, S., Schreck, E., Smith, R., Wang, N., Reiner, J., . . . Bogy, D. (2024). Protocol for nanoscale thermal mapping of electronic devices using atomic force microscopy with phase change material. Elsevier.
Citace podle Chicago (17th ed.)Cheng, Qilong, Sukumar Rajauria, Erhard Schreck, Robert Smith, Na Wang, Jim Reiner, Qing Dai, a David Bogy. Protocol for Nanoscale Thermal Mapping of Electronic Devices Using Atomic Force Microscopy with Phase Change Material. Elsevier, 2024.
Citace podle MLA (9th ed.)Cheng, Qilong, et al. Protocol for Nanoscale Thermal Mapping of Electronic Devices Using Atomic Force Microscopy with Phase Change Material. Elsevier, 2024.
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