Cita APA (7a ed.)

Cheng, Q., Rajauria, S., Schreck, E., Smith, R., Wang, N., Reiner, J., . . . Bogy, D. (2024). Protocol for nanoscale thermal mapping of electronic devices using atomic force microscopy with phase change material. Elsevier.

Cita Chicago Style (17a ed.)

Cheng, Qilong, Sukumar Rajauria, Erhard Schreck, Robert Smith, Na Wang, Jim Reiner, Qing Dai, y David Bogy. Protocol for Nanoscale Thermal Mapping of Electronic Devices Using Atomic Force Microscopy with Phase Change Material. Elsevier, 2024.

Cita MLA (9a ed.)

Cheng, Qilong, et al. Protocol for Nanoscale Thermal Mapping of Electronic Devices Using Atomic Force Microscopy with Phase Change Material. Elsevier, 2024.