Cheng, Q., Rajauria, S., Schreck, E., Smith, R., Wang, N., Reiner, J., . . . Bogy, D. (2024). Protocol for nanoscale thermal mapping of electronic devices using atomic force microscopy with phase change material. Elsevier.
Citación estilo ChicagoCheng, Qilong, Sukumar Rajauria, Erhard Schreck, Robert Smith, Na Wang, Jim Reiner, Qing Dai, and David Bogy. Protocol for Nanoscale Thermal Mapping of Electronic Devices Using Atomic Force Microscopy with Phase Change Material. Elsevier, 2024.
Cita MLACheng, Qilong, et al. Protocol for Nanoscale Thermal Mapping of Electronic Devices Using Atomic Force Microscopy with Phase Change Material. Elsevier, 2024.
Warning: These citations may not always be 100% accurate.