Cheng, Q., Rajauria, S., Schreck, E., Smith, R., Wang, N., Reiner, J., . . . Bogy, D. (2024). Protocol for nanoscale thermal mapping of electronic devices using atomic force microscopy with phase change material. Elsevier.
Chicagoスタイル(17版)引用形式Cheng, Qilong, Sukumar Rajauria, Erhard Schreck, Robert Smith, Na Wang, Jim Reiner, Qing Dai, , David Bogy. Protocol for Nanoscale Thermal Mapping of Electronic Devices Using Atomic Force Microscopy with Phase Change Material. Elsevier, 2024.
MLA(9版)引用形式Cheng, Qilong, et al. Protocol for Nanoscale Thermal Mapping of Electronic Devices Using Atomic Force Microscopy with Phase Change Material. Elsevier, 2024.
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