Cheng, Q., Rajauria, S., Schreck, E., Smith, R., Wang, N., Reiner, J., . . . Bogy, D. (2024). Protocol for nanoscale thermal mapping of electronic devices using atomic force microscopy with phase change material. Elsevier.
Chicago-čujuhus (17. p.)Cheng, Qilong, Sukumar Rajauria, Erhard Schreck, Robert Smith, Na Wang, Jim Reiner, Qing Dai, juo David Bogy. Protocol for Nanoscale Thermal Mapping of Electronic Devices Using Atomic Force Microscopy with Phase Change Material. Elsevier, 2024.
MLA-čujuhus (9. p.)Cheng, Qilong, et al. Protocol for Nanoscale Thermal Mapping of Electronic Devices Using Atomic Force Microscopy with Phase Change Material. Elsevier, 2024.
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