Protocol for nanoscale thermal mapping of electronic devices using atomic force microscopy with phase change material
Summary: In this protocol, we present a facile nanoscale thermal mapping technique for electronic devices by use of atomic force microscopy and a phase change material Ge2Sb2Te5. We describe steps for Ge2Sb2Te5 thin film coating, Ge2Sb2Te5 temperature calibration, thermal mapping by varying heater p...
| المؤلفون الرئيسيون: | , , , , , , , |
|---|---|
| التنسيق: | مقال |
| اللغة: | English |
| منشور في: |
Elsevier
2024-06-01
|
| سلاسل: | STAR Protocols |
| الموضوعات: | |
| الوصول للمادة أونلاين: | http://www.sciencedirect.com/science/article/pii/S2666166724002041 |