Identification of Loci and Candidate Genes Responsible for Pod Dehiscence in Soybean via Genome-Wide Association Analysis Across Multiple Environments

Identification of Loci and Candidate Genes Responsible for Pod Dehiscence in Soybean via Genome-Wide Association Analysis Across Multiple Environments

Pod dehiscence (shattering) is the main cause of serious yield loss during the soybean mechanical harvesting process. A better understanding of the genetic architecture and molecular mechanisms of pod dehiscence is of great significance for soybean breeding. In this study, genome-wide association an...

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Bibliographic Details
Main Authors: Dezhou Hu, Guizhen Kan, Wei Hu, Yali Li, Derong Hao, Xiao Li, Hui Yang, Zhongyi Yang, Xiaohong He, Fang Huang, Deyue Yu
Format: Article
Language:English
Published: Frontiers Media S.A. 2019-06-01
Series:Frontiers in Plant Science
Subjects:
soybean
pod dehiscence
GWAS
haplotype analysis
Glyma09g06290
polymorphism analysis
Online Access:https://www.frontiersin.org/article/10.3389/fpls.2019.00811/full

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