Improving electrochromic properties of V2O5 smart film through Ti incorporation: Local atomic and electronic perspectives
In this work, vanadium pentoxide (V2O5) and titanium-modified V2O5 thin films were synthesized using the sol-gel spin coating route. The effect of Ti-doping concentration on the electrochromic optical properties and atomic/electronic structures of V2O5 smart thin films is examined. As the doping con...
| Main Authors: | , , , , , , , , , , , , |
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| Format: | Article |
| Language: | English |
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Elsevier
2024-05-01
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| Series: | Optical Materials: X |
| Subjects: | |
| Online Access: | http://www.sciencedirect.com/science/article/pii/S2590147824000135 |
| _version_ | 1827221853467312128 |
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| author | I-Han Wu Arvind Chandrasekar Kumaravelu Thanigai Arul Yu-Cheng Huang Ta Thi Thuy Nga Chi-Liang Chen Jeng-Lung Chen Da-Hua Wei Kandasami Asokan Ping-Hung Yeh Chao-Hung Du Wu-Ching Chou Chung-Li Dong |
| author_facet | I-Han Wu Arvind Chandrasekar Kumaravelu Thanigai Arul Yu-Cheng Huang Ta Thi Thuy Nga Chi-Liang Chen Jeng-Lung Chen Da-Hua Wei Kandasami Asokan Ping-Hung Yeh Chao-Hung Du Wu-Ching Chou Chung-Li Dong |
| author_sort | I-Han Wu |
| collection | DOAJ |
| description | In this work, vanadium pentoxide (V2O5) and titanium-modified V2O5 thin films were synthesized using the sol-gel spin coating route. The effect of Ti-doping concentration on the electrochromic optical properties and atomic/electronic structures of V2O5 smart thin films is examined. As the doping concentration of Ti increases, the surface roughness of the films is reduced. The structure of the films is analyzed using X-ray diffraction (XRD) and Raman spectroscopy, while the electrochromic modulation of atomic and electronic structures is elucidated through Raman and X-ray absorption spectroscopy (XAS) conducted during lithiation and delithiation. The XRD patterns demonstrate that an increase in Ti concentration leads to a more amorphous structure of the films and a shift of the main diffraction peak to a lower angle, attributable to the enlarged spacing between the stacking layers resulting from the incorporation of Ti ions. Soft X-ray absorption spectroscopy (XAS) and in situ hard XAS of the V L-edge, the O K-edge, and the V K-edge revealed a reduction in the charge state of V and local atomic structural symmetry modification upon lithated coloration and delithiated bleaching process. The critical insights provided by in situ XAS provides reveal that a small amount of Ti has the ability to modify the interlayer distance and local atomic structure of V2O5, thereby improving its electrochromic switching rate and stability when utilized in smart windows. |
| first_indexed | 2024-03-07T22:54:37Z |
| format | Article |
| id | doaj.art-c1709d79d31f48779271dd9c74f8fd50 |
| institution | Directory Open Access Journal |
| issn | 2590-1478 |
| language | English |
| last_indexed | 2025-03-21T16:29:12Z |
| publishDate | 2024-05-01 |
| publisher | Elsevier |
| record_format | Article |
| series | Optical Materials: X |
| spelling | doaj.art-c1709d79d31f48779271dd9c74f8fd502024-06-17T05:56:31ZengElsevierOptical Materials: X2590-14782024-05-0122100301Improving electrochromic properties of V2O5 smart film through Ti incorporation: Local atomic and electronic perspectivesI-Han Wu0Arvind Chandrasekar1Kumaravelu Thanigai Arul2Yu-Cheng Huang3Ta Thi Thuy Nga4Chi-Liang Chen5Jeng-Lung Chen6Da-Hua Wei7Kandasami Asokan8Ping-Hung Yeh9Chao-Hung Du10Wu-Ching Chou11Chung-Li Dong12Research Center for X-ray Science & Department of Physics, Tamkang University, Tamsui, 25137, TaiwanResearch Center for X-ray Science & Department of Physics, Tamkang University, Tamsui, 25137, TaiwanResearch Center for X-ray Science & Department of Physics, Tamkang University, Tamsui, 25137, TaiwanNational Synchrotron Radiation Research Center, Hsinchu, 30076, Taiwan; Department of Electrophysics, National Yang Ming Chiao Tung University, Hsinchu, 30010, TaiwanResearch Center for X-ray Science & Department of Physics, Tamkang University, Tamsui, 25137, Taiwan; Department of Electrophysics, National Yang Ming Chiao Tung University, Hsinchu, 30010, TaiwanNational Synchrotron Radiation Research Center, Hsinchu, 30076, TaiwanNational Synchrotron Radiation Research Center, Hsinchu, 30076, TaiwanDepartment of Mechanical Engineering and Institute of Manufacturing Technology, National Taipei University of Technology, Taipei, 106, TaiwanDepartment of Physics & Centre for Interdisciplinary Research, University of Petroleum and Energy Studies (UPES) Dehradun, Uttarakhand, 248007, IndiaResearch Center for X-ray Science & Department of Physics, Tamkang University, Tamsui, 25137, TaiwanResearch Center for X-ray Science & Department of Physics, Tamkang University, Tamsui, 25137, TaiwanDepartment of Electrophysics, National Yang Ming Chiao Tung University, Hsinchu, 30010, Taiwan; Corresponding author.Research Center for X-ray Science & Department of Physics, Tamkang University, Tamsui, 25137, Taiwan; Corresponding author.In this work, vanadium pentoxide (V2O5) and titanium-modified V2O5 thin films were synthesized using the sol-gel spin coating route. The effect of Ti-doping concentration on the electrochromic optical properties and atomic/electronic structures of V2O5 smart thin films is examined. As the doping concentration of Ti increases, the surface roughness of the films is reduced. The structure of the films is analyzed using X-ray diffraction (XRD) and Raman spectroscopy, while the electrochromic modulation of atomic and electronic structures is elucidated through Raman and X-ray absorption spectroscopy (XAS) conducted during lithiation and delithiation. The XRD patterns demonstrate that an increase in Ti concentration leads to a more amorphous structure of the films and a shift of the main diffraction peak to a lower angle, attributable to the enlarged spacing between the stacking layers resulting from the incorporation of Ti ions. Soft X-ray absorption spectroscopy (XAS) and in situ hard XAS of the V L-edge, the O K-edge, and the V K-edge revealed a reduction in the charge state of V and local atomic structural symmetry modification upon lithated coloration and delithiated bleaching process. The critical insights provided by in situ XAS provides reveal that a small amount of Ti has the ability to modify the interlayer distance and local atomic structure of V2O5, thereby improving its electrochromic switching rate and stability when utilized in smart windows.http://www.sciencedirect.com/science/article/pii/S2590147824000135X-ray absorption spectroscopyIn situ x-ray absorption spectroscopyElectronic structureAtomic structureSmart windowElectrochromism |
| spellingShingle | I-Han Wu Arvind Chandrasekar Kumaravelu Thanigai Arul Yu-Cheng Huang Ta Thi Thuy Nga Chi-Liang Chen Jeng-Lung Chen Da-Hua Wei Kandasami Asokan Ping-Hung Yeh Chao-Hung Du Wu-Ching Chou Chung-Li Dong Improving electrochromic properties of V2O5 smart film through Ti incorporation: Local atomic and electronic perspectives Optical Materials: X X-ray absorption spectroscopy In situ x-ray absorption spectroscopy Electronic structure Atomic structure Smart window Electrochromism |
| title | Improving electrochromic properties of V2O5 smart film through Ti incorporation: Local atomic and electronic perspectives |
| title_full | Improving electrochromic properties of V2O5 smart film through Ti incorporation: Local atomic and electronic perspectives |
| title_fullStr | Improving electrochromic properties of V2O5 smart film through Ti incorporation: Local atomic and electronic perspectives |
| title_full_unstemmed | Improving electrochromic properties of V2O5 smart film through Ti incorporation: Local atomic and electronic perspectives |
| title_short | Improving electrochromic properties of V2O5 smart film through Ti incorporation: Local atomic and electronic perspectives |
| title_sort | improving electrochromic properties of v2o5 smart film through ti incorporation local atomic and electronic perspectives |
| topic | X-ray absorption spectroscopy In situ x-ray absorption spectroscopy Electronic structure Atomic structure Smart window Electrochromism |
| url | http://www.sciencedirect.com/science/article/pii/S2590147824000135 |
| work_keys_str_mv | AT ihanwu improvingelectrochromicpropertiesofv2o5smartfilmthroughtiincorporationlocalatomicandelectronicperspectives AT arvindchandrasekar improvingelectrochromicpropertiesofv2o5smartfilmthroughtiincorporationlocalatomicandelectronicperspectives AT kumaraveluthanigaiarul improvingelectrochromicpropertiesofv2o5smartfilmthroughtiincorporationlocalatomicandelectronicperspectives AT yuchenghuang improvingelectrochromicpropertiesofv2o5smartfilmthroughtiincorporationlocalatomicandelectronicperspectives AT tathithuynga improvingelectrochromicpropertiesofv2o5smartfilmthroughtiincorporationlocalatomicandelectronicperspectives AT chiliangchen improvingelectrochromicpropertiesofv2o5smartfilmthroughtiincorporationlocalatomicandelectronicperspectives AT jenglungchen improvingelectrochromicpropertiesofv2o5smartfilmthroughtiincorporationlocalatomicandelectronicperspectives AT dahuawei improvingelectrochromicpropertiesofv2o5smartfilmthroughtiincorporationlocalatomicandelectronicperspectives AT kandasamiasokan improvingelectrochromicpropertiesofv2o5smartfilmthroughtiincorporationlocalatomicandelectronicperspectives AT pinghungyeh improvingelectrochromicpropertiesofv2o5smartfilmthroughtiincorporationlocalatomicandelectronicperspectives AT chaohungdu improvingelectrochromicpropertiesofv2o5smartfilmthroughtiincorporationlocalatomicandelectronicperspectives AT wuchingchou improvingelectrochromicpropertiesofv2o5smartfilmthroughtiincorporationlocalatomicandelectronicperspectives AT chunglidong improvingelectrochromicpropertiesofv2o5smartfilmthroughtiincorporationlocalatomicandelectronicperspectives |