Probing two-level systems with electron spin inversion recovery of defects at the Si/SiO_{2} interface

The main feature of amorphous materials is the presence of excess vibrational modes at low energies, giving rise to the so-called “boson peak” in neutron and optical spectroscopies. These same modes manifest themselves as two-level systems (TLSs) causing noise and decoherence in qubits and other sen...

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Main Authors: M. Belli, M. Fanciulli, R. de Sousa
Format: Article
Language:English
Published: American Physical Society 2020-09-01
Series:Physical Review Research
Online Access:http://doi.org/10.1103/PhysRevResearch.2.033507
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author M. Belli
M. Fanciulli
R. de Sousa
author_facet M. Belli
M. Fanciulli
R. de Sousa
author_sort M. Belli
collection DOAJ
description The main feature of amorphous materials is the presence of excess vibrational modes at low energies, giving rise to the so-called “boson peak” in neutron and optical spectroscopies. These same modes manifest themselves as two-level systems (TLSs) causing noise and decoherence in qubits and other sensitive devices. Here, we present an experiment that uses the spin relaxation of dangling bonds at the Si/(amorphous)SiO_{2} interface as a probe of TLSs. We introduce a model that is able to explain the observed nonexponential electron spin inversion recovery and provides a measure of the degree of spatial localization and concentration of the TLSs close to the interface, their maximum energy, and its temperature dependence.
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spelling doaj.art-c2073a3c0a0f4dc097ba4c2fcd6ccdd82024-04-12T17:01:24ZengAmerican Physical SocietyPhysical Review Research2643-15642020-09-012303350710.1103/PhysRevResearch.2.033507Probing two-level systems with electron spin inversion recovery of defects at the Si/SiO_{2} interfaceM. BelliM. FanciulliR. de SousaThe main feature of amorphous materials is the presence of excess vibrational modes at low energies, giving rise to the so-called “boson peak” in neutron and optical spectroscopies. These same modes manifest themselves as two-level systems (TLSs) causing noise and decoherence in qubits and other sensitive devices. Here, we present an experiment that uses the spin relaxation of dangling bonds at the Si/(amorphous)SiO_{2} interface as a probe of TLSs. We introduce a model that is able to explain the observed nonexponential electron spin inversion recovery and provides a measure of the degree of spatial localization and concentration of the TLSs close to the interface, their maximum energy, and its temperature dependence.http://doi.org/10.1103/PhysRevResearch.2.033507
spellingShingle M. Belli
M. Fanciulli
R. de Sousa
Probing two-level systems with electron spin inversion recovery of defects at the Si/SiO_{2} interface
Physical Review Research
title Probing two-level systems with electron spin inversion recovery of defects at the Si/SiO_{2} interface
title_full Probing two-level systems with electron spin inversion recovery of defects at the Si/SiO_{2} interface
title_fullStr Probing two-level systems with electron spin inversion recovery of defects at the Si/SiO_{2} interface
title_full_unstemmed Probing two-level systems with electron spin inversion recovery of defects at the Si/SiO_{2} interface
title_short Probing two-level systems with electron spin inversion recovery of defects at the Si/SiO_{2} interface
title_sort probing two level systems with electron spin inversion recovery of defects at the si sio 2 interface
url http://doi.org/10.1103/PhysRevResearch.2.033507
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