Investigations on tailoring physical properties of RF magnetron sputtered Cadmium Sulphide thin films

The effect of nitrogen (N2) partial pressure on the structure and bandgap tunability of RF magnetron sputtered Cadmium Sulphide (CdS) thin films is investigated by varying N2 partial pressure in Ar/N2 mixture. In presence of N2, films have a polycrystalline structure with (002) preferential orientat...

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Main Authors: Harshita Trivedi, Zohreh Ghorannevis, Shilpi Chaudhary, Avanish S. Parmar
Format: Article
Language:English
Published: Elsevier 2023-06-01
Series:Materials Letters: X
Subjects:
Online Access:http://www.sciencedirect.com/science/article/pii/S2590150823000108
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author Harshita Trivedi
Zohreh Ghorannevis
Shilpi Chaudhary
Avanish S. Parmar
author_facet Harshita Trivedi
Zohreh Ghorannevis
Shilpi Chaudhary
Avanish S. Parmar
author_sort Harshita Trivedi
collection DOAJ
description The effect of nitrogen (N2) partial pressure on the structure and bandgap tunability of RF magnetron sputtered Cadmium Sulphide (CdS) thin films is investigated by varying N2 partial pressure in Ar/N2 mixture. In presence of N2, films have a polycrystalline structure with (002) preferential orientation, which leads to defect-free, continuous, dense, and fibrous structures with increased roughness. The average optical transmittance increased to > 80 at 500–2500 nm for 30 % N2 partial pressure, whereas the band gap decreases from 2.45 eV to 2.30 eV with increasing N2 concentration. This work shows that the bandgap of sputtered CdS thin films can be tuned with the variation of N2 concentration for customized applications.
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spelling doaj.art-c23034c9675c4e6aa140878c8bca8d6b2023-06-19T04:29:24ZengElsevierMaterials Letters: X2590-15082023-06-0118100190Investigations on tailoring physical properties of RF magnetron sputtered Cadmium Sulphide thin filmsHarshita Trivedi0Zohreh Ghorannevis1Shilpi Chaudhary2Avanish S. Parmar3Department of Physics, Indian Institute of Technology (BHU), Varanasi, IndiaDepartment of Physics, Karaj Branch, Islamic Azad University, Karaj, IranDepartment of Applied Sciences, Punjab Engineering College (Deemed to be University), Chandigarh, India; Corresponding authors.Department of Physics, Indian Institute of Technology (BHU), Varanasi, India; Corresponding authors.The effect of nitrogen (N2) partial pressure on the structure and bandgap tunability of RF magnetron sputtered Cadmium Sulphide (CdS) thin films is investigated by varying N2 partial pressure in Ar/N2 mixture. In presence of N2, films have a polycrystalline structure with (002) preferential orientation, which leads to defect-free, continuous, dense, and fibrous structures with increased roughness. The average optical transmittance increased to > 80 at 500–2500 nm for 30 % N2 partial pressure, whereas the band gap decreases from 2.45 eV to 2.30 eV with increasing N2 concentration. This work shows that the bandgap of sputtered CdS thin films can be tuned with the variation of N2 concentration for customized applications.http://www.sciencedirect.com/science/article/pii/S2590150823000108CdSRF sputteringThin-filmsOptical propertiesN2 concentration
spellingShingle Harshita Trivedi
Zohreh Ghorannevis
Shilpi Chaudhary
Avanish S. Parmar
Investigations on tailoring physical properties of RF magnetron sputtered Cadmium Sulphide thin films
Materials Letters: X
CdS
RF sputtering
Thin-films
Optical properties
N2 concentration
title Investigations on tailoring physical properties of RF magnetron sputtered Cadmium Sulphide thin films
title_full Investigations on tailoring physical properties of RF magnetron sputtered Cadmium Sulphide thin films
title_fullStr Investigations on tailoring physical properties of RF magnetron sputtered Cadmium Sulphide thin films
title_full_unstemmed Investigations on tailoring physical properties of RF magnetron sputtered Cadmium Sulphide thin films
title_short Investigations on tailoring physical properties of RF magnetron sputtered Cadmium Sulphide thin films
title_sort investigations on tailoring physical properties of rf magnetron sputtered cadmium sulphide thin films
topic CdS
RF sputtering
Thin-films
Optical properties
N2 concentration
url http://www.sciencedirect.com/science/article/pii/S2590150823000108
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