Three-dimensional nanoscale imaging by plasmonic Brownian microscopy
Three-dimensional (3D) imaging at the nanoscale is a key to understanding of nanomaterials and complex systems. While scanning probe microscopy (SPM) has been the workhorse of nanoscale metrology, its slow scanning speed by a single probe tip can limit the application of SPM to wide-field imaging of...
| Main Authors: | , , , , , , , |
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| Format: | Article |
| Language: | English |
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De Gruyter
2017-12-01
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| Series: | Nanophotonics |
| Subjects: | |
| Online Access: | http://www.degruyter.com/view/j/nanoph.2018.7.issue-2/nanoph-2017-0075/nanoph-2017-0075.xml?format=INT |
| _version_ | 1818406715315453952 |
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| author | Labno Anna Gladden Christopher Kim Jeongmin Lu Dylan Yin Xiaobo Wang Yuan Liu Zhaowei Zhang Xiang |
| author_facet | Labno Anna Gladden Christopher Kim Jeongmin Lu Dylan Yin Xiaobo Wang Yuan Liu Zhaowei Zhang Xiang |
| author_sort | Labno Anna |
| collection | DOAJ |
| description | Three-dimensional (3D) imaging at the nanoscale is a key to understanding of nanomaterials and complex systems. While scanning probe microscopy (SPM) has been the workhorse of nanoscale metrology, its slow scanning speed by a single probe tip can limit the application of SPM to wide-field imaging of 3D complex nanostructures. Both electron microscopy and optical tomography allow 3D imaging, but are limited to the use in vacuum environment due to electron scattering and to optical resolution in micron scales, respectively. Here we demonstrate plasmonic Brownian microscopy (PBM) as a way to improve the imaging speed of SPM. Unlike photonic force microscopy where a single trapped particle is used for a serial scanning, PBM utilizes a massive number of plasmonic nanoparticles (NPs) under Brownian diffusion in solution to scan in parallel around the unlabeled sample object. The motion of NPs under an evanescent field is three-dimensionally localized to reconstruct the super-resolution topology of 3D dielectric objects. Our method allows high throughput imaging of complex 3D structures over a large field of view, even with internal structures such as cavities that cannot be accessed by conventional mechanical tips in SPM. |
| first_indexed | 2024-12-14T09:16:21Z |
| format | Article |
| id | doaj.art-c24b28b30f2e4ff49414f80648e352dc |
| institution | Directory Open Access Journal |
| issn | 2192-8614 |
| language | English |
| last_indexed | 2024-12-14T09:16:21Z |
| publishDate | 2017-12-01 |
| publisher | De Gruyter |
| record_format | Article |
| series | Nanophotonics |
| spelling | doaj.art-c24b28b30f2e4ff49414f80648e352dc2022-12-21T23:08:27ZengDe GruyterNanophotonics2192-86142017-12-017248949510.1515/nanoph-2017-0075nanoph-2017-0075Three-dimensional nanoscale imaging by plasmonic Brownian microscopyLabno Anna0Gladden Christopher1Kim Jeongmin2Lu Dylan3Yin Xiaobo4Wang Yuan5Liu Zhaowei6Zhang Xiang7NSF Nanoscale Science and Engineering Center (NSEC), University of California, Berkeley, CA 94720, USANSF Nanoscale Science and Engineering Center (NSEC), University of California, Berkeley, CA 94720, USANSF Nanoscale Science and Engineering Center (NSEC), University of California, Berkeley, CA 94720, USADepartment of Electrical and Computer Engineering, University of California, San Diego, CA 92093, USANSF Nanoscale Science and Engineering Center (NSEC), University of California, Berkeley, CA 94720, USANSF Nanoscale Science and Engineering Center (NSEC), University of California, Berkeley, CA 94720, USADepartment of Electrical and Computer Engineering, University of California, 9500 Gilman Drive, La Jolla, San Diego, CA 92093, USANSF Nanoscale Science and Engineering Center (NSEC), University of California, 3112 Etcheverry Hall, Berkeley, CA 94720, USAThree-dimensional (3D) imaging at the nanoscale is a key to understanding of nanomaterials and complex systems. While scanning probe microscopy (SPM) has been the workhorse of nanoscale metrology, its slow scanning speed by a single probe tip can limit the application of SPM to wide-field imaging of 3D complex nanostructures. Both electron microscopy and optical tomography allow 3D imaging, but are limited to the use in vacuum environment due to electron scattering and to optical resolution in micron scales, respectively. Here we demonstrate plasmonic Brownian microscopy (PBM) as a way to improve the imaging speed of SPM. Unlike photonic force microscopy where a single trapped particle is used for a serial scanning, PBM utilizes a massive number of plasmonic nanoparticles (NPs) under Brownian diffusion in solution to scan in parallel around the unlabeled sample object. The motion of NPs under an evanescent field is three-dimensionally localized to reconstruct the super-resolution topology of 3D dielectric objects. Our method allows high throughput imaging of complex 3D structures over a large field of view, even with internal structures such as cavities that cannot be accessed by conventional mechanical tips in SPM.http://www.degruyter.com/view/j/nanoph.2018.7.issue-2/nanoph-2017-0075/nanoph-2017-0075.xml?format=INT3D nano-imagingBrownian motionmicroscopyparallel scanningevanescent field |
| spellingShingle | Labno Anna Gladden Christopher Kim Jeongmin Lu Dylan Yin Xiaobo Wang Yuan Liu Zhaowei Zhang Xiang Three-dimensional nanoscale imaging by plasmonic Brownian microscopy Nanophotonics 3D nano-imaging Brownian motion microscopy parallel scanning evanescent field |
| title | Three-dimensional nanoscale imaging by plasmonic Brownian microscopy |
| title_full | Three-dimensional nanoscale imaging by plasmonic Brownian microscopy |
| title_fullStr | Three-dimensional nanoscale imaging by plasmonic Brownian microscopy |
| title_full_unstemmed | Three-dimensional nanoscale imaging by plasmonic Brownian microscopy |
| title_short | Three-dimensional nanoscale imaging by plasmonic Brownian microscopy |
| title_sort | three dimensional nanoscale imaging by plasmonic brownian microscopy |
| topic | 3D nano-imaging Brownian motion microscopy parallel scanning evanescent field |
| url | http://www.degruyter.com/view/j/nanoph.2018.7.issue-2/nanoph-2017-0075/nanoph-2017-0075.xml?format=INT |
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