Lee, S., Kim, T., & Heo, J. (2023). Cross-Loss Pseudo Labeling for Semi-Supervised Segmentation. IEEE.
Chicago Style (17th ed.) CitationLee, Seungyeol, Taeho Kim, and Jae-Pil Heo. Cross-Loss Pseudo Labeling for Semi-Supervised Segmentation. IEEE, 2023.
MLA (9th ed.) CitationLee, Seungyeol, et al. Cross-Loss Pseudo Labeling for Semi-Supervised Segmentation. IEEE, 2023.
Warning: These citations may not always be 100% accurate.