Modeling and Analytical Description of Parasitic Probe Effects in Measurements of Conductor-Backed Coplanar Waveguides

<p>On-wafer measurements are of fundamental importance to the characterization of active and passive devices at millimetre-wave frequencies. They have been commonly known to be ambitious and challenging due to the occurrence of parasitic effects originating from probes, multimode propagation,...

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Main Authors: G. N. Phung, U. Arz
Format: Article
Language:deu
Published: Copernicus Publications 2023-04-01
Series:Advances in Radio Science
Online Access:https://ars.copernicus.org/articles/20/119/2023/ars-20-119-2023.pdf
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author G. N. Phung
G. N. Phung
U. Arz
author_facet G. N. Phung
G. N. Phung
U. Arz
author_sort G. N. Phung
collection DOAJ
description <p>On-wafer measurements are of fundamental importance to the characterization of active and passive devices at millimetre-wave frequencies. They have been commonly known to be ambitious and challenging due to the occurrence of parasitic effects originating from probes, multimode propagation, crosstalk between adjacent structures and radiation. While a lot of investigations have been performed for conventional coplanar waveguides (CPW) measured on ceramic chucks, the parasitic effects occuring in conductor-backed CPWs (CB-CPWs) have not been fully understood yet. Therefore, this paper presents a thorough study for CB-CPWs based on electromagnetic simulations. Additionally, this paper proposes an analytical description accounting for the probe geometries to predict the occurrence of resonance effects due to the propagation of the parallel-plate-line (PPL) mode. For the first time, a new analytical description including the effects of the probe geometries is presented and validated by both measurements and simulations.</p>
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spelling doaj.art-c32ce7bda6e5415e9dd50e859cb39f872023-04-27T12:43:11ZdeuCopernicus PublicationsAdvances in Radio Science1684-99651684-99732023-04-012011912910.5194/ars-20-119-2023Modeling and Analytical Description of Parasitic Probe Effects in Measurements of Conductor-Backed Coplanar WaveguidesG. N. Phung0G. N. Phung1U. Arz2High Frequency and Electromagnetic Fields, Physikalisch-Technische Bundesanstalt (PTB), Bundesallee 100, 38116 Braunschweig, Germany​​​​​​​For this work, Gia Ngoc Phung received the Young Scientist Award from the German URSI member committee at the Kleinheubacher Tagung 2021.High Frequency and Electromagnetic Fields, Physikalisch-Technische Bundesanstalt (PTB), Bundesallee 100, 38116 Braunschweig, Germany​​​​​​​<p>On-wafer measurements are of fundamental importance to the characterization of active and passive devices at millimetre-wave frequencies. They have been commonly known to be ambitious and challenging due to the occurrence of parasitic effects originating from probes, multimode propagation, crosstalk between adjacent structures and radiation. While a lot of investigations have been performed for conventional coplanar waveguides (CPW) measured on ceramic chucks, the parasitic effects occuring in conductor-backed CPWs (CB-CPWs) have not been fully understood yet. Therefore, this paper presents a thorough study for CB-CPWs based on electromagnetic simulations. Additionally, this paper proposes an analytical description accounting for the probe geometries to predict the occurrence of resonance effects due to the propagation of the parallel-plate-line (PPL) mode. For the first time, a new analytical description including the effects of the probe geometries is presented and validated by both measurements and simulations.</p>https://ars.copernicus.org/articles/20/119/2023/ars-20-119-2023.pdf
spellingShingle G. N. Phung
G. N. Phung
U. Arz
Modeling and Analytical Description of Parasitic Probe Effects in Measurements of Conductor-Backed Coplanar Waveguides
Advances in Radio Science
title Modeling and Analytical Description of Parasitic Probe Effects in Measurements of Conductor-Backed Coplanar Waveguides
title_full Modeling and Analytical Description of Parasitic Probe Effects in Measurements of Conductor-Backed Coplanar Waveguides
title_fullStr Modeling and Analytical Description of Parasitic Probe Effects in Measurements of Conductor-Backed Coplanar Waveguides
title_full_unstemmed Modeling and Analytical Description of Parasitic Probe Effects in Measurements of Conductor-Backed Coplanar Waveguides
title_short Modeling and Analytical Description of Parasitic Probe Effects in Measurements of Conductor-Backed Coplanar Waveguides
title_sort modeling and analytical description of parasitic probe effects in measurements of conductor backed coplanar waveguides
url https://ars.copernicus.org/articles/20/119/2023/ars-20-119-2023.pdf
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