Modeling and Analytical Description of Parasitic Probe Effects in Measurements of Conductor-Backed Coplanar Waveguides
<p>On-wafer measurements are of fundamental importance to the characterization of active and passive devices at millimetre-wave frequencies. They have been commonly known to be ambitious and challenging due to the occurrence of parasitic effects originating from probes, multimode propagation,...
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Format: | Article |
Language: | deu |
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Copernicus Publications
2023-04-01
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Series: | Advances in Radio Science |
Online Access: | https://ars.copernicus.org/articles/20/119/2023/ars-20-119-2023.pdf |
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author | G. N. Phung G. N. Phung U. Arz |
author_facet | G. N. Phung G. N. Phung U. Arz |
author_sort | G. N. Phung |
collection | DOAJ |
description | <p>On-wafer measurements are of fundamental importance to the characterization of active and passive devices at millimetre-wave frequencies. They have been commonly known to be ambitious and challenging due to the occurrence of parasitic effects originating from probes, multimode propagation, crosstalk between adjacent structures and radiation. While a lot of investigations have been performed for conventional coplanar waveguides (CPW) measured on ceramic chucks, the parasitic effects occuring in conductor-backed CPWs (CB-CPWs) have not been fully understood yet. Therefore, this paper presents a thorough study for CB-CPWs based on electromagnetic simulations. Additionally, this paper proposes an analytical description accounting for the probe geometries to predict the occurrence of resonance effects due to the propagation of the parallel-plate-line (PPL) mode. For the first time, a new analytical description including the effects of the probe geometries is presented and validated by both measurements and simulations.</p> |
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institution | Directory Open Access Journal |
issn | 1684-9965 1684-9973 |
language | deu |
last_indexed | 2024-04-09T15:40:13Z |
publishDate | 2023-04-01 |
publisher | Copernicus Publications |
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series | Advances in Radio Science |
spelling | doaj.art-c32ce7bda6e5415e9dd50e859cb39f872023-04-27T12:43:11ZdeuCopernicus PublicationsAdvances in Radio Science1684-99651684-99732023-04-012011912910.5194/ars-20-119-2023Modeling and Analytical Description of Parasitic Probe Effects in Measurements of Conductor-Backed Coplanar WaveguidesG. N. Phung0G. N. Phung1U. Arz2High Frequency and Electromagnetic Fields, Physikalisch-Technische Bundesanstalt (PTB), Bundesallee 100, 38116 Braunschweig, GermanyFor this work, Gia Ngoc Phung received the Young Scientist Award from the German URSI member committee at the Kleinheubacher Tagung 2021.High Frequency and Electromagnetic Fields, Physikalisch-Technische Bundesanstalt (PTB), Bundesallee 100, 38116 Braunschweig, Germany<p>On-wafer measurements are of fundamental importance to the characterization of active and passive devices at millimetre-wave frequencies. They have been commonly known to be ambitious and challenging due to the occurrence of parasitic effects originating from probes, multimode propagation, crosstalk between adjacent structures and radiation. While a lot of investigations have been performed for conventional coplanar waveguides (CPW) measured on ceramic chucks, the parasitic effects occuring in conductor-backed CPWs (CB-CPWs) have not been fully understood yet. Therefore, this paper presents a thorough study for CB-CPWs based on electromagnetic simulations. Additionally, this paper proposes an analytical description accounting for the probe geometries to predict the occurrence of resonance effects due to the propagation of the parallel-plate-line (PPL) mode. For the first time, a new analytical description including the effects of the probe geometries is presented and validated by both measurements and simulations.</p>https://ars.copernicus.org/articles/20/119/2023/ars-20-119-2023.pdf |
spellingShingle | G. N. Phung G. N. Phung U. Arz Modeling and Analytical Description of Parasitic Probe Effects in Measurements of Conductor-Backed Coplanar Waveguides Advances in Radio Science |
title | Modeling and Analytical Description of Parasitic Probe Effects in Measurements of Conductor-Backed Coplanar Waveguides |
title_full | Modeling and Analytical Description of Parasitic Probe Effects in Measurements of Conductor-Backed Coplanar Waveguides |
title_fullStr | Modeling and Analytical Description of Parasitic Probe Effects in Measurements of Conductor-Backed Coplanar Waveguides |
title_full_unstemmed | Modeling and Analytical Description of Parasitic Probe Effects in Measurements of Conductor-Backed Coplanar Waveguides |
title_short | Modeling and Analytical Description of Parasitic Probe Effects in Measurements of Conductor-Backed Coplanar Waveguides |
title_sort | modeling and analytical description of parasitic probe effects in measurements of conductor backed coplanar waveguides |
url | https://ars.copernicus.org/articles/20/119/2023/ars-20-119-2023.pdf |
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