Modeling and Analytical Description of Parasitic Probe Effects in Measurements of Conductor-Backed Coplanar Waveguides
<p>On-wafer measurements are of fundamental importance to the characterization of active and passive devices at millimetre-wave frequencies. They have been commonly known to be ambitious and challenging due to the occurrence of parasitic effects originating from probes, multimode propagation,...
| Main Authors: | , |
|---|---|
| Format: | Article |
| Language: | deu |
| Published: |
Copernicus Publications
2023-04-01
|
| Series: | Advances in Radio Science |
| Online Access: | https://ars.copernicus.org/articles/20/119/2023/ars-20-119-2023.pdf |