Evolutionary algorithm design based on evolutionary efficiency factor

With the development of electronic chip technology, circuit systems become gradually high integrated and intelligent. Under the interface of complex electromagnetic field environment, the requirements for the stability and reliability of information electronic system are getting more and more urgent...

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Bibliographic Details
Main Authors: Huicong WU, Jie YU
Format: Article
Language:zho
Published: Hebei University of Science and Technology 2018-06-01
Series:Journal of Hebei University of Science and Technology
Subjects:
Online Access:http://xuebao.hebust.edu.cn/hbkjdx/ch/reader/create_pdf.aspx?file_no=b201803012&flag=1&journal_
Description
Summary:With the development of electronic chip technology, circuit systems become gradually high integrated and intelligent. Under the interface of complex electromagnetic field environment, the requirements for the stability and reliability of information electronic system are getting more and more urgent. The autonomous fault-tolerant capability and reliability of the circuit system are faced with new challenges in circuit design. In order to improve the anti-interference ability of circuit under bad conditions, the obtained evolutionary efficiency factor after analyses is taken as the influence factor of the algorithm, and it is introduced into the fitness function of the algorithm to improve the algorithm. The research result show that for the single point short circuit and open circuit fault simulation experiments, the average fault-free probabilities of the evolutionary algorithm based on evolutionary efficiency factor are 0.754 and 0.853, respectively; compared with the traditional evolutionary algorithm, the two probabilities increase by 16.4% and 14%, respectively; compared with the adaptive algorithm, the two probabilities increase by 6.7% and 5%, respectively. It is proved that the introduction of evolution efficiency factor can improve the robustness and fault-tolerance ability of the circuit system under the effect of interference or local damage. The research result may provide reference for the reinforcement and optimization of the improved circuit design.
ISSN:1008-1542