Modeling of Static Negative Bias Temperature Stressing in p-channel VDMOSFETs using Least Square Method
| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
MIDEM Society - Society for Microelectronics, Electronic Components and Materials
2020-11-01
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| Series: | Informacije MIDEM |
| Subjects: | |
| Online Access: | http://www.midem-drustvo.si/Journal%20papers/MIDEM_50(2020)3p205.pdf |
| _version_ | 1818381768710946816 |
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| author | N. Mitrović D. Danković B. Ranđelović Z. Prijić N. Stojadinović |
| author_facet | N. Mitrović D. Danković B. Ranđelović Z. Prijić N. Stojadinović |
| author_sort | N. Mitrović |
| collection | DOAJ |
| first_indexed | 2024-12-14T02:39:50Z |
| format | Article |
| id | doaj.art-c3dd92871680443f976707cc45176eff |
| institution | Directory Open Access Journal |
| issn | 0352-9045 2232-6979 |
| language | English |
| last_indexed | 2024-12-14T02:39:50Z |
| publishDate | 2020-11-01 |
| publisher | MIDEM Society - Society for Microelectronics, Electronic Components and Materials |
| record_format | Article |
| series | Informacije MIDEM |
| spelling | doaj.art-c3dd92871680443f976707cc45176eff2022-12-21T23:20:02ZengMIDEM Society - Society for Microelectronics, Electronic Components and MaterialsInformacije MIDEM0352-90452232-69792020-11-01503205214https://doi.org/10.33180/InfMIDEM2020.305Modeling of Static Negative Bias Temperature Stressing in p-channel VDMOSFETs using Least Square MethodN. MitrovićD. DankovićB. RanđelovićZ. PrijićN. Stojadinovićhttp://www.midem-drustvo.si/Journal%20papers/MIDEM_50(2020)3p205.pdfnbtivdmosfetelectrical circuitmodelingleast square method |
| spellingShingle | N. Mitrović D. Danković B. Ranđelović Z. Prijić N. Stojadinović Modeling of Static Negative Bias Temperature Stressing in p-channel VDMOSFETs using Least Square Method Informacije MIDEM nbti vdmosfet electrical circuit modeling least square method |
| title | Modeling of Static Negative Bias Temperature Stressing in p-channel VDMOSFETs using Least Square Method |
| title_full | Modeling of Static Negative Bias Temperature Stressing in p-channel VDMOSFETs using Least Square Method |
| title_fullStr | Modeling of Static Negative Bias Temperature Stressing in p-channel VDMOSFETs using Least Square Method |
| title_full_unstemmed | Modeling of Static Negative Bias Temperature Stressing in p-channel VDMOSFETs using Least Square Method |
| title_short | Modeling of Static Negative Bias Temperature Stressing in p-channel VDMOSFETs using Least Square Method |
| title_sort | modeling of static negative bias temperature stressing in p channel vdmosfets using least square method |
| topic | nbti vdmosfet electrical circuit modeling least square method |
| url | http://www.midem-drustvo.si/Journal%20papers/MIDEM_50(2020)3p205.pdf |
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