An Equivalent-Effect Phenomenon in Eddy Current Non-Destructive Testing of Thin Structures

An Equivalent-Effect Phenomenon in Eddy Current Non-Destructive Testing of Thin Structures

The inductance/impedance due to thin metallic structures in non-destructive testing (NDT) is difficult to evaluate. In particular, in finite element method (FEM) eddy current simulation, an extremely fine mesh is required to accurately simulate skin effects especially at high frequencies, and this c...

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Bibliographic Details
Main Authors: Wuliang Yin, Jiawei Tang, Mingyang Lu, Hanyang Xu, Ruochen Huang, Qian Zhao, Zhijie Zhang, Anthony Peyton
Format: Article
Language:English
Published: IEEE 2019-01-01
Series:IEEE Access
Subjects:
Eddy current testing
electrical conductivity
non-destructive testing (NDT)
skin effects
thickness measurement
Online Access:https://ieeexplore.ieee.org/document/8715765/

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