Quantitative Modeling of Near-Field Interactions in Terahertz Near-Field Microscopy
Terahertz scattering-scanning near-field optical microscopy (THz s-SNOM), combining the best features of terahertz technology and s-SNOM technology, has shown unique advantages in various applications. Consequently, building a model to characterize near-field interactions and investigate practical i...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2023-03-01
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| Series: | Applied Sciences |
| Subjects: | |
| Online Access: | https://www.mdpi.com/2076-3417/13/6/3400 |