Interface Structure, Dielectric Behavior and Temperature Stability of Ba(Mg<sub>1/3</sub>Ta<sub>2/3</sub>)O<sub>3</sub>/PbZr<sub>0.52</sub>Ti<sub>0.48</sub>O<sub>3</sub> Thin Films

Interface Structure, Dielectric Behavior and Temperature Stability of Ba(Mg<sub>1/3</sub>Ta<sub>2/3</sub>)O<sub>3</sub>/PbZr<sub>0.52</sub>Ti<sub>0.48</sub>O<sub>3</sub> Thin Films

Multilayer films can achieve advanced properties and a wide range of applications. The heterogeneous interface plays an important role in the performances of multilayer films. In this paper, the effects of the interface of Ba(Mg<sub>1/3</sub>Ta<sub>2/3</sub>)O<sub>3<...

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Bibliographic Details
Main Authors:	Zhi Wu, Yifei Liu, Jing Zhou, Hong Zhao, Zhihui Qin
Format:	Article
Language:	English
Published:	MDPI AG 2023-09-01
Series:	Materials
Subjects:	BMT/PZT thin films interface number dielectric behavior temperature stability
Online Access:	https://www.mdpi.com/1996-1944/16/19/6358

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