Advanced materials nanocharacterization

<p>Abstract</p> <p>This special issue of <it>Nanoscale Research Letters </it>contains scientific contributions presented at the Symposium D <it>"Multidimensional Electrical and Chemical Characterization at the Nanometer-scale of Organic and Inorganic Semicond...

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Bibliographic Details
Main Authors: L&#225;nyi Stefan, Eyben Pierre, Camassel Jean, Baranowski Jacek, Giannazzo Filippo
Format: Article
Language:English
Published: SpringerOpen 2011-01-01
Series:Nanoscale Research Letters
Online Access:http://www.nanoscalereslett.com/content/6/1/107
Description
Summary:<p>Abstract</p> <p>This special issue of <it>Nanoscale Research Letters </it>contains scientific contributions presented at the Symposium D <it>"Multidimensional Electrical and Chemical Characterization at the Nanometer-scale of Organic and Inorganic Semiconductors" </it>of the E-MRS Fall Meeting 2010, which was held in Warsaw, Poland from 13<sup>th </sup>to 17<sup>th </sup>September, 2010.</p>
ISSN:1931-7573
1556-276X