Probing relaxations of atomic-scale junctions in the Pauli repulsion range
Clean metal as well as C _60 -terminated tips of an atomic force microscope probe the interaction with C _60 molecules adsorbed on Cu(111) and Pb(111). The force measurements unveil a monotonic shift of the point of maximum attraction with the bias voltage. The conventional superposition of long-ran...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
IOP Publishing
2019-01-01
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| Series: | New Journal of Physics |
| Subjects: | |
| Online Access: | https://doi.org/10.1088/1367-2630/ab4c84 |
| Summary: | Clean metal as well as C _60 -terminated tips of an atomic force microscope probe the interaction with C _60 molecules adsorbed on Cu(111) and Pb(111). The force measurements unveil a monotonic shift of the point of maximum attraction with the bias voltage. The conventional superposition of long-range van der Waals and electrostatic forces with short-range Pauli repulsion does not reproduce the shift. By phenomenologically including bias-dependent relaxations of the electrode geometry in the analytical expression for the short-range force the experimental data can qualitatively be described. |
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| ISSN: | 1367-2630 |