A Hybrid Model for Prognostic and Health Management of Electronic Devices

A Hybrid Model for Prognostic and Health Management of Electronic Devices

Techniques for prognostic and health management are becoming common in the electronic domain to reduce the cost of failures. Typically, the proposed techniques rely either on physics-based or data-driven models. Only a few studies explored hybrid models to combine the advantages of both models. For...

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Bibliographic Details
Main Authors: Alessandro Murgia, Chaitra Harsha, Elena Tsiporkova, Chinmay Nawghane, Bart Vandevelde
Format: Article
Language:English
Published: MDPI AG 2024-02-01
Series:Electronics
Subjects:
reliability
QFN
package delamination
PHM
RUL
health index
Online Access:https://www.mdpi.com/2079-9292/13/3/642

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