Large-Scale Defect Clusters with Hexagonal Honeycomb-like Arrangement in Ammonothermal GaN Crystals

Large-Scale Defect Clusters with Hexagonal Honeycomb-like Arrangement in Ammonothermal GaN Crystals

In this paper, we investigate, using X-ray Bragg diffraction imaging and defect selective etching, a new type of extended defect that occurs in ammonothermally grown gallium nitride (GaN) single crystals. This hexagonal “honeycomb” shaped defect is composed of bundles of parallel threading edge disl...

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Bibliographic Details
Main Authors: Lutz Kirste, Thu Nhi Tran Thi Caliste, Jan L. Weyher, Julita Smalc-Koziorowska, Magdalena A. Zajac, Robert Kucharski, Tomasz Sochacki, Karolina Grabianska, Malgorzata Iwinska, Carsten Detlefs, Andreas N. Danilewsky, Michal Bockowski, José Baruchel
Format: Article
Language:English
Published: MDPI AG 2022-10-01
Series:Materials
Subjects:
gallium nitride (GaN)
X-ray Bragg diffraction imaging
rocking curve imaging
defect selective etching
honeycomb defect
limited size subgrain boundary
Online Access:https://www.mdpi.com/1996-1944/15/19/6996

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