Evaluation and Optimization of a MOEMS Active Focusing Device

In this paper we present a detailed evaluation of a micro-opto-electromechanical system (MOEMS) for active focusing which is realized using an electrostatically deformed thin silicon membrane. The evaluation is done using finite element methods and experimental characterization of the device behavio...

Full description

Bibliographic Details
Main Authors: Ulrich Mescheder, Michael Lootze, Khaled Aljasem
Format: Article
Language:English
Published: MDPI AG 2021-02-01
Series:Micromachines
Subjects:
Online Access:https://www.mdpi.com/2072-666X/12/2/172
_version_ 1797412120555421696
author Ulrich Mescheder
Michael Lootze
Khaled Aljasem
author_facet Ulrich Mescheder
Michael Lootze
Khaled Aljasem
author_sort Ulrich Mescheder
collection DOAJ
description In this paper we present a detailed evaluation of a micro-opto-electromechanical system (MOEMS) for active focusing which is realized using an electrostatically deformed thin silicon membrane. The evaluation is done using finite element methods and experimental characterization of the device behavior. The devices are realized in silicon on insulator technology. The influence of internal stress especially resulting from the high compressive buried oxide (BOX) layer is evaluated. Additionally, the effect of stress gradients in the crystalline device layer and of high reflective coatings such as aluminum is discussed. The influence of variations of some important process steps on the device performance is quantified. Finally, practical properties such as focal length control, long-term stability, hysteresis and dynamical response are presented and evaluated. The evaluation proves that the proposed membrane focusing device is suitable for high performance imaging (wavefront errors between λ/5–λ/10) with a large aperture (5 mm).
first_indexed 2024-03-09T04:56:32Z
format Article
id doaj.art-c5090355c57d4c4e93344a23f0ee2c7f
institution Directory Open Access Journal
issn 2072-666X
language English
last_indexed 2024-03-09T04:56:32Z
publishDate 2021-02-01
publisher MDPI AG
record_format Article
series Micromachines
spelling doaj.art-c5090355c57d4c4e93344a23f0ee2c7f2023-12-03T13:04:50ZengMDPI AGMicromachines2072-666X2021-02-0112217210.3390/mi12020172Evaluation and Optimization of a MOEMS Active Focusing DeviceUlrich Mescheder0Michael Lootze1Khaled Aljasem2Department of Mechanical & Medical Engineering, Institute for Microsystems Technology (IMST), Furtwangen University, Robert-Gerwig-Platz 1, 78120 Furtwangen, GermanyDepartment of Mechanical & Medical Engineering, Institute for Microsystems Technology (IMST), Furtwangen University, Robert-Gerwig-Platz 1, 78120 Furtwangen, GermanyZ-LASER GmbH, Merzhauser Str. 134, 79100 Freiburg im Breisgau, GermanyIn this paper we present a detailed evaluation of a micro-opto-electromechanical system (MOEMS) for active focusing which is realized using an electrostatically deformed thin silicon membrane. The evaluation is done using finite element methods and experimental characterization of the device behavior. The devices are realized in silicon on insulator technology. The influence of internal stress especially resulting from the high compressive buried oxide (BOX) layer is evaluated. Additionally, the effect of stress gradients in the crystalline device layer and of high reflective coatings such as aluminum is discussed. The influence of variations of some important process steps on the device performance is quantified. Finally, practical properties such as focal length control, long-term stability, hysteresis and dynamical response are presented and evaluated. The evaluation proves that the proposed membrane focusing device is suitable for high performance imaging (wavefront errors between λ/5–λ/10) with a large aperture (5 mm).https://www.mdpi.com/2072-666X/12/2/172adaptive opticsMOEMSSOIelectrostatic actuationactive focusingthin film stress
spellingShingle Ulrich Mescheder
Michael Lootze
Khaled Aljasem
Evaluation and Optimization of a MOEMS Active Focusing Device
Micromachines
adaptive optics
MOEMS
SOI
electrostatic actuation
active focusing
thin film stress
title Evaluation and Optimization of a MOEMS Active Focusing Device
title_full Evaluation and Optimization of a MOEMS Active Focusing Device
title_fullStr Evaluation and Optimization of a MOEMS Active Focusing Device
title_full_unstemmed Evaluation and Optimization of a MOEMS Active Focusing Device
title_short Evaluation and Optimization of a MOEMS Active Focusing Device
title_sort evaluation and optimization of a moems active focusing device
topic adaptive optics
MOEMS
SOI
electrostatic actuation
active focusing
thin film stress
url https://www.mdpi.com/2072-666X/12/2/172
work_keys_str_mv AT ulrichmescheder evaluationandoptimizationofamoemsactivefocusingdevice
AT michaellootze evaluationandoptimizationofamoemsactivefocusingdevice
AT khaledaljasem evaluationandoptimizationofamoemsactivefocusingdevice