Ultrahigh Resolution Thickness Measurement Technique Based on a Hollow Core Optical Fiber Structure
An ultrahigh resolution thickness measurement sensor was proposed based on a single mode–hollow core–single mode (SMF–HCF–SMF) fiber structure by coating a thin layer of material on the HCF surface. Theoretical analysis shows that the SMF–HCF–SMF fiber structure can measure coating thickness down to...
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MDPI AG
2020-04-01
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Online Access: | https://www.mdpi.com/1424-8220/20/7/2035 |
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author | Zheyu Wu Bin Liu Jiangfeng Zhu Juan Liu Shengpeng Wan Tao Wu Jinghua Sun |
author_facet | Zheyu Wu Bin Liu Jiangfeng Zhu Juan Liu Shengpeng Wan Tao Wu Jinghua Sun |
author_sort | Zheyu Wu |
collection | DOAJ |
description | An ultrahigh resolution thickness measurement sensor was proposed based on a single mode–hollow core–single mode (SMF–HCF–SMF) fiber structure by coating a thin layer of material on the HCF surface. Theoretical analysis shows that the SMF–HCF–SMF fiber structure can measure coating thickness down to sub-nanometers. An experimental study was carried out by coating a thin layer of graphene oxide (GO) on the HCF surface of the fabricated SMF–HCF–SMF fiber structure. The experimental results show that the fiber sensor structure can detect a thin layer with a thickness down to 0.21 nanometers, which agrees well with the simulation results. The proposed sensing technology has the advantages of simple configuration, ease of fabrication, low cost, high resolution, and good repeatability, which offer great potential for practical thickness measurement applications. |
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issn | 1424-8220 |
language | English |
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publishDate | 2020-04-01 |
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spelling | doaj.art-c5b6eacffb7c47b98a16e98f9fca85fa2023-11-19T20:44:10ZengMDPI AGSensors1424-82202020-04-01207203510.3390/s20072035Ultrahigh Resolution Thickness Measurement Technique Based on a Hollow Core Optical Fiber StructureZheyu Wu0Bin Liu1Jiangfeng Zhu2Juan Liu3Shengpeng Wan4Tao Wu5Jinghua Sun6School of Physics and Optoelectronic Engineering, Xidian University, Xi’an 710071, ChinaNational Engineering Laboratory for Destructive Testing and Optoelectronic Sensing Technology and Application, Nanchang Hang Kong University, Nanchang 330063, ChinaSchool of Physics and Optoelectronic Engineering, Xidian University, Xi’an 710071, ChinaNational Engineering Laboratory for Destructive Testing and Optoelectronic Sensing Technology and Application, Nanchang Hang Kong University, Nanchang 330063, ChinaNational Engineering Laboratory for Destructive Testing and Optoelectronic Sensing Technology and Application, Nanchang Hang Kong University, Nanchang 330063, ChinaNational Engineering Laboratory for Destructive Testing and Optoelectronic Sensing Technology and Application, Nanchang Hang Kong University, Nanchang 330063, ChinaSch Elect Engn & Intelligentizat, Dongguan University of Technology, Dongguan 523808, ChinaAn ultrahigh resolution thickness measurement sensor was proposed based on a single mode–hollow core–single mode (SMF–HCF–SMF) fiber structure by coating a thin layer of material on the HCF surface. Theoretical analysis shows that the SMF–HCF–SMF fiber structure can measure coating thickness down to sub-nanometers. An experimental study was carried out by coating a thin layer of graphene oxide (GO) on the HCF surface of the fabricated SMF–HCF–SMF fiber structure. The experimental results show that the fiber sensor structure can detect a thin layer with a thickness down to 0.21 nanometers, which agrees well with the simulation results. The proposed sensing technology has the advantages of simple configuration, ease of fabrication, low cost, high resolution, and good repeatability, which offer great potential for practical thickness measurement applications.https://www.mdpi.com/1424-8220/20/7/2035optical fiber sensinghollow core optical fibergraphene oxide (GO)thickness measurement |
spellingShingle | Zheyu Wu Bin Liu Jiangfeng Zhu Juan Liu Shengpeng Wan Tao Wu Jinghua Sun Ultrahigh Resolution Thickness Measurement Technique Based on a Hollow Core Optical Fiber Structure Sensors optical fiber sensing hollow core optical fiber graphene oxide (GO) thickness measurement |
title | Ultrahigh Resolution Thickness Measurement Technique Based on a Hollow Core Optical Fiber Structure |
title_full | Ultrahigh Resolution Thickness Measurement Technique Based on a Hollow Core Optical Fiber Structure |
title_fullStr | Ultrahigh Resolution Thickness Measurement Technique Based on a Hollow Core Optical Fiber Structure |
title_full_unstemmed | Ultrahigh Resolution Thickness Measurement Technique Based on a Hollow Core Optical Fiber Structure |
title_short | Ultrahigh Resolution Thickness Measurement Technique Based on a Hollow Core Optical Fiber Structure |
title_sort | ultrahigh resolution thickness measurement technique based on a hollow core optical fiber structure |
topic | optical fiber sensing hollow core optical fiber graphene oxide (GO) thickness measurement |
url | https://www.mdpi.com/1424-8220/20/7/2035 |
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