Ultrahigh Resolution Thickness Measurement Technique Based on a Hollow Core Optical Fiber Structure
An ultrahigh resolution thickness measurement sensor was proposed based on a single mode–hollow core–single mode (SMF–HCF–SMF) fiber structure by coating a thin layer of material on the HCF surface. Theoretical analysis shows that the SMF–HCF–SMF fiber structure can measure coating thickness down to...
Main Authors: | Zheyu Wu, Bin Liu, Jiangfeng Zhu, Juan Liu, Shengpeng Wan, Tao Wu, Jinghua Sun |
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Format: | Article |
Language: | English |
Published: |
MDPI AG
2020-04-01
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Series: | Sensors |
Subjects: | |
Online Access: | https://www.mdpi.com/1424-8220/20/7/2035 |
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