Study of the charge transfer process in the polyaniline/graphite heterojunction by conductive atomic force microscopy
Thin layers of polyaniline on the surface of highly oriented pyrolytic graphite are obtained by in-situ chemical oxidative polymerization of aniline. The current-voltage characteristics of the tip/polyaniline/graphite contact, which have a form characteristic of tunnel contacts, have been measur...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
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Omsk State Technical University, Federal State Autonoumos Educational Institution of Higher Education
2020-11-01
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| Series: | Омский научный вестник |
| Subjects: | |
| Online Access: | https://www.omgtu.ru/general_information/media_omgtu/journal_of_omsk_research_journal/files/arhiv/2020/5%20(173)/94-98%20%D0%94%D0%B0%D0%B2%D0%BB%D0%B5%D1%82%D0%BA%D0%B8%D0%BB%D1%8C%D0%B4%D0%B5%D0%B5%D0%B2%20%D0%9D.%20%D0%90.,%20%D0%9C%D0%BE%D1%81%D1%83%D1%80%20%D0%95.%20%D0%AE.,%20%D0%A1%D0%BE%D0%BA%D0%BE%D0%BB%D0%BE%D0%B2%20%D0%94.%20%D0%92.%20%D0%B8%20%D0%B4%D1%80..pdf |
| _version_ | 1826841252166893568 |
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| author | N. A. Davletkildeev E. Yu. Mosur D. V. Sokolov I. A. Lobov |
| author_facet | N. A. Davletkildeev E. Yu. Mosur D. V. Sokolov I. A. Lobov |
| author_sort | N. A. Davletkildeev |
| collection | DOAJ |
| description | Thin layers of polyaniline on the surface of highly oriented
pyrolytic graphite are obtained by in-situ chemical oxidative
polymerization of aniline. The current-voltage characteristics
of the tip/polyaniline/graphite contact, which have a form
characteristic of tunnel contacts, have been measured by the
method of conducting atomic force microscopy. By modeling
the current-voltage characteristics using the Simmons model,
the width of the potential barrier is determined, which for the
investigated heterojunction is 0,5 nm. |
| first_indexed | 2024-12-10T16:45:37Z |
| format | Article |
| id | doaj.art-c5d0b95874a54797bec2996aa61d65a2 |
| institution | Directory Open Access Journal |
| issn | 1813-8225 2541-7541 |
| language | English |
| last_indexed | 2025-02-16T12:56:59Z |
| publishDate | 2020-11-01 |
| publisher | Omsk State Technical University, Federal State Autonoumos Educational Institution of Higher Education |
| record_format | Article |
| series | Омский научный вестник |
| spelling | doaj.art-c5d0b95874a54797bec2996aa61d65a22025-02-02T18:26:44ZengOmsk State Technical University, Federal State Autonoumos Educational Institution of Higher EducationОмский научный вестник1813-82252541-75412020-11-015 (173)949810.25206/1813-8225-2020-173-94-98Study of the charge transfer process in the polyaniline/graphite heterojunction by conductive atomic force microscopyN. A. Davletkildeev0https://orcid.org/0000-0002-5591-6118E. Yu. Mosur1https://orcid.org/0000-0003-4890-0297D. V. Sokolov2https://orcid.org/0000-0002-8120-6638I. A. Lobov3https://orcid.org/0000-0003-2527-1715Omsk Scientific Center of Siberian Branch of Russian Academy of SciencesOmsk Scientific Center of Siberian Branch of Russian Academy of SciencesOmsk Scientific Center of Siberian Branch of Russian Academy of SciencesOmsk Scientific Center of Siberian Branch of Russian Academy of SciencesThin layers of polyaniline on the surface of highly oriented pyrolytic graphite are obtained by in-situ chemical oxidative polymerization of aniline. The current-voltage characteristics of the tip/polyaniline/graphite contact, which have a form characteristic of tunnel contacts, have been measured by the method of conducting atomic force microscopy. By modeling the current-voltage characteristics using the Simmons model, the width of the potential barrier is determined, which for the investigated heterojunction is 0,5 nm.https://www.omgtu.ru/general_information/media_omgtu/journal_of_omsk_research_journal/files/arhiv/2020/5%20(173)/94-98%20%D0%94%D0%B0%D0%B2%D0%BB%D0%B5%D1%82%D0%BA%D0%B8%D0%BB%D1%8C%D0%B4%D0%B5%D0%B5%D0%B2%20%D0%9D.%20%D0%90.,%20%D0%9C%D0%BE%D1%81%D1%83%D1%80%20%D0%95.%20%D0%AE.,%20%D0%A1%D0%BE%D0%BA%D0%BE%D0%BB%D0%BE%D0%B2%20%D0%94.%20%D0%92.%20%D0%B8%20%D0%B4%D1%80..pdfpolyanilinegraphiteheterojunctionconductive atomic force microscopypotential barrier width |
| spellingShingle | N. A. Davletkildeev E. Yu. Mosur D. V. Sokolov I. A. Lobov Study of the charge transfer process in the polyaniline/graphite heterojunction by conductive atomic force microscopy Омский научный вестник polyaniline graphite heterojunction conductive atomic force microscopy potential barrier width |
| title | Study of the charge transfer process in the polyaniline/graphite heterojunction by conductive atomic force microscopy |
| title_full | Study of the charge transfer process in the polyaniline/graphite heterojunction by conductive atomic force microscopy |
| title_fullStr | Study of the charge transfer process in the polyaniline/graphite heterojunction by conductive atomic force microscopy |
| title_full_unstemmed | Study of the charge transfer process in the polyaniline/graphite heterojunction by conductive atomic force microscopy |
| title_short | Study of the charge transfer process in the polyaniline/graphite heterojunction by conductive atomic force microscopy |
| title_sort | study of the charge transfer process in the polyaniline graphite heterojunction by conductive atomic force microscopy |
| topic | polyaniline graphite heterojunction conductive atomic force microscopy potential barrier width |
| url | https://www.omgtu.ru/general_information/media_omgtu/journal_of_omsk_research_journal/files/arhiv/2020/5%20(173)/94-98%20%D0%94%D0%B0%D0%B2%D0%BB%D0%B5%D1%82%D0%BA%D0%B8%D0%BB%D1%8C%D0%B4%D0%B5%D0%B5%D0%B2%20%D0%9D.%20%D0%90.,%20%D0%9C%D0%BE%D1%81%D1%83%D1%80%20%D0%95.%20%D0%AE.,%20%D0%A1%D0%BE%D0%BA%D0%BE%D0%BB%D0%BE%D0%B2%20%D0%94.%20%D0%92.%20%D0%B8%20%D0%B4%D1%80..pdf |
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