Polarization Aberrations in High-Numerical-Aperture Lens Systems and Their Effects on Vectorial-Information Sensing
The importance of polarization aberrations has been recognized and studied in numerous optical systems and related applications. It is known that polarization aberrations are particularly crucial in certain photogrammetry and microscopy techniques that are related to vectorial information—such as po...
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MDPI AG
2022-04-01
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Online Access: | https://www.mdpi.com/2072-4292/14/8/1932 |
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author | Yuanxing Shen Binguo Chen Chao He Honghui He Jun Guo Jian Wu Daniel S. Elson Hui Ma |
author_facet | Yuanxing Shen Binguo Chen Chao He Honghui He Jun Guo Jian Wu Daniel S. Elson Hui Ma |
author_sort | Yuanxing Shen |
collection | DOAJ |
description | The importance of polarization aberrations has been recognized and studied in numerous optical systems and related applications. It is known that polarization aberrations are particularly crucial in certain photogrammetry and microscopy techniques that are related to vectorial information—such as polarization imaging, stimulated emission depletion microscopy, and structured illumination microscopy. Hence, a reduction in polarization aberrations would be beneficial to different types of optical imaging/sensing techniques with enhanced vectorial information. In this work, we first analyzed the intrinsic polarization aberrations induced by a high-NA lens theoretically and experimentally. The aberrations of depolarization, diattenuation, and linear retardance were studied in detail using the Mueller matrix polar-decomposition method. Based on an analysis of the results, we proposed strategies to compensate the polarization aberrations induced by high-NA lenses for hardware-based solutions. The preliminary imaging results obtained using a Mueller matrix polarimeter equipped with multiple coated aspheric lenses for polarization-aberration reduction confirmed that the conclusions and strategies proposed in this study had the potential to provide more precise polarization information of the targets for applications spanning across classical optics, remote sensing, biomedical imaging, photogrammetry, and vectorial optical-information extraction. |
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issn | 2072-4292 |
language | English |
last_indexed | 2024-03-09T13:04:06Z |
publishDate | 2022-04-01 |
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series | Remote Sensing |
spelling | doaj.art-c5d1ba4962794bc39d036c00d9f81e1a2023-11-30T21:51:41ZengMDPI AGRemote Sensing2072-42922022-04-01148193210.3390/rs14081932Polarization Aberrations in High-Numerical-Aperture Lens Systems and Their Effects on Vectorial-Information SensingYuanxing Shen0Binguo Chen1Chao He2Honghui He3Jun Guo4Jian Wu5Daniel S. Elson6Hui Ma7Guangdong Research Center of Polarization Imaging and Measurement Engineering Technology, Shenzhen Key Laboratory for Minimal Invasive Medical Technologies, Institute of Optical Imaging and Sensing, Tsinghua Shenzhen International Graduate School, Tsinghua University, Shenzhen 518055, ChinaGuangdong Research Center of Polarization Imaging and Measurement Engineering Technology, Shenzhen Key Laboratory for Minimal Invasive Medical Technologies, Institute of Optical Imaging and Sensing, Tsinghua Shenzhen International Graduate School, Tsinghua University, Shenzhen 518055, ChinaDepartment of Engineering Science, University of Oxford, Parks Road, Oxford OX1 3PJ, UKGuangdong Research Center of Polarization Imaging and Measurement Engineering Technology, Shenzhen Key Laboratory for Minimal Invasive Medical Technologies, Institute of Optical Imaging and Sensing, Tsinghua Shenzhen International Graduate School, Tsinghua University, Shenzhen 518055, ChinaGuangdong Research Center of Polarization Imaging and Measurement Engineering Technology, Shenzhen Key Laboratory for Minimal Invasive Medical Technologies, Institute of Optical Imaging and Sensing, Tsinghua Shenzhen International Graduate School, Tsinghua University, Shenzhen 518055, ChinaInstitute of Biopharmaceutical and Health Engineering, Tsinghua Shenzhen International Graduate School, Tsinghua University, Shenzhen 518055, ChinaHamlyn Centre for Robotic Surgery, Institute of Global Health Innovation, Imperial College London, Exhibition Road, London SW7 2AZ, UKGuangdong Research Center of Polarization Imaging and Measurement Engineering Technology, Shenzhen Key Laboratory for Minimal Invasive Medical Technologies, Institute of Optical Imaging and Sensing, Tsinghua Shenzhen International Graduate School, Tsinghua University, Shenzhen 518055, ChinaThe importance of polarization aberrations has been recognized and studied in numerous optical systems and related applications. It is known that polarization aberrations are particularly crucial in certain photogrammetry and microscopy techniques that are related to vectorial information—such as polarization imaging, stimulated emission depletion microscopy, and structured illumination microscopy. Hence, a reduction in polarization aberrations would be beneficial to different types of optical imaging/sensing techniques with enhanced vectorial information. In this work, we first analyzed the intrinsic polarization aberrations induced by a high-NA lens theoretically and experimentally. The aberrations of depolarization, diattenuation, and linear retardance were studied in detail using the Mueller matrix polar-decomposition method. Based on an analysis of the results, we proposed strategies to compensate the polarization aberrations induced by high-NA lenses for hardware-based solutions. The preliminary imaging results obtained using a Mueller matrix polarimeter equipped with multiple coated aspheric lenses for polarization-aberration reduction confirmed that the conclusions and strategies proposed in this study had the potential to provide more precise polarization information of the targets for applications spanning across classical optics, remote sensing, biomedical imaging, photogrammetry, and vectorial optical-information extraction.https://www.mdpi.com/2072-4292/14/8/1932vectorial informationpolarization aberrationhigh-numerical-aperture lensmicroscopyremote sensing |
spellingShingle | Yuanxing Shen Binguo Chen Chao He Honghui He Jun Guo Jian Wu Daniel S. Elson Hui Ma Polarization Aberrations in High-Numerical-Aperture Lens Systems and Their Effects on Vectorial-Information Sensing Remote Sensing vectorial information polarization aberration high-numerical-aperture lens microscopy remote sensing |
title | Polarization Aberrations in High-Numerical-Aperture Lens Systems and Their Effects on Vectorial-Information Sensing |
title_full | Polarization Aberrations in High-Numerical-Aperture Lens Systems and Their Effects on Vectorial-Information Sensing |
title_fullStr | Polarization Aberrations in High-Numerical-Aperture Lens Systems and Their Effects on Vectorial-Information Sensing |
title_full_unstemmed | Polarization Aberrations in High-Numerical-Aperture Lens Systems and Their Effects on Vectorial-Information Sensing |
title_short | Polarization Aberrations in High-Numerical-Aperture Lens Systems and Their Effects on Vectorial-Information Sensing |
title_sort | polarization aberrations in high numerical aperture lens systems and their effects on vectorial information sensing |
topic | vectorial information polarization aberration high-numerical-aperture lens microscopy remote sensing |
url | https://www.mdpi.com/2072-4292/14/8/1932 |
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