Using Double-Layer Patch-Based Contrast for Infrared Small Target Detection

Detecting infrared (IR) small targets effectively and robustly is crucial for the tasks such as infrared searching and guarding. While methods based on the human vision system (HVS) have achieved great success in this field, detecting dim targets in complex backgrounds remains a challenge due to the...

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Bibliographic Details
Main Authors: Liping Liu, Yantao Wei, Yue Wang, Huang Yao, Di Chen
Format: Article
Language:English
Published: MDPI AG 2023-08-01
Series:Remote Sensing
Subjects:
Online Access:https://www.mdpi.com/2072-4292/15/15/3839
Description
Summary:Detecting infrared (IR) small targets effectively and robustly is crucial for the tasks such as infrared searching and guarding. While methods based on the human vision system (HVS) have achieved great success in this field, detecting dim targets in complex backgrounds remains a challenge due to the multi-scale framework and over-simplified disparity calculations. In this paper, infrared small targets are detected with a novel local contrast measurement named double-layer patch-based contrast (DLPC). Firstly, we crafted an elaborated double-layer local contrast measure, to suppress the background, which can accurately measure the gray difference between the target and its surrounding complex background. Secondly, we calculated the absolute value of the grayscale difference between the target and the background in the diagonal directions as a weighting factor to further enhance the target. Then, an adaptive threshold on the DLPC was employed to extract the target from the IR image. The proposed method can detect small targets effectively with a fixed-scaled mask template while being computationally efficient. Experimental results in terms of background suppression factor (BSF), signal-to-clutter ratio gain (SCRG) and receiver operating characteristic (ROC) curve on five IR image datasets demonstrated that the proposed method has better detection performance compared to six state-of-the-art methods and is more robust in addressing complex backgrounds.
ISSN:2072-4292