The investigation of ferromagnetic resonance linewidth in Ni80Fe20 films with submicron rectangular elements
Patterned magnetic films with nano-scaled dots exhibit some special magnetic properties. In this paper, we investigate the in-plane shape anisotropy and the magnetization dynamic damping in permalloy (Ni80Fe20) arrays of submicron rectangular elements using ferromagnetic resonance (FMR). The FMR lin...
| Main Authors: | , , , , , |
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| Format: | Article |
| Language: | English |
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AIP Publishing LLC
2016-05-01
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| Series: | AIP Advances |
| Online Access: | http://dx.doi.org/10.1063/1.4944768 |
| _version_ | 1818205258161061888 |
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| author | D. Zhang J. J. Yue Z. X. Kou L. Lin Y. Zhai H. R. Zhai |
| author_facet | D. Zhang J. J. Yue Z. X. Kou L. Lin Y. Zhai H. R. Zhai |
| author_sort | D. Zhang |
| collection | DOAJ |
| description | Patterned magnetic films with nano-scaled dots exhibit some special magnetic properties. In this paper, we investigate the in-plane shape anisotropy and the magnetization dynamic damping in permalloy (Ni80Fe20) arrays of submicron rectangular elements using ferromagnetic resonance (FMR). The FMR linewidth exhibits a dependence on the element size, and mainly comes from the contribution of the intrinsic damping. Also the contribution of two-magnon scattering plays an important role and is reduced with increasing aspect ratio. The damping coefficient decreases from 0.0129 to 0.0118 with the element length increasing from 300 nm to 1200 nm, and the theoretical calculation suggests that the change of damping results from the longitudinal and transverse interlayer spin current due to the spatially inhomogeneous magnetization dynamics. |
| first_indexed | 2024-12-12T03:54:16Z |
| format | Article |
| id | doaj.art-c638273f9d964ca6ac3457a8e11b9423 |
| institution | Directory Open Access Journal |
| issn | 2158-3226 |
| language | English |
| last_indexed | 2024-12-12T03:54:16Z |
| publishDate | 2016-05-01 |
| publisher | AIP Publishing LLC |
| record_format | Article |
| series | AIP Advances |
| spelling | doaj.art-c638273f9d964ca6ac3457a8e11b94232022-12-22T00:39:17ZengAIP Publishing LLCAIP Advances2158-32262016-05-0165056125056125-610.1063/1.4944768164691ADVThe investigation of ferromagnetic resonance linewidth in Ni80Fe20 films with submicron rectangular elementsD. Zhang0J. J. Yue1Z. X. Kou2L. Lin3Y. Zhai4H. R. Zhai5Department of Physics, Southeast University, Nanjing, 211189, ChinaDepartment of Physics, Southeast University, Nanjing, 211189, ChinaDepartment of Physics, Southeast University, Nanjing, 211189, ChinaDepartment of Physics, Southeast University, Nanjing, 211189, ChinaDepartment of Physics, Southeast University, Nanjing, 211189, ChinaNational Laboratory of Solid Microstructures, Nanjing University, Nanjing, 210093, ChinaPatterned magnetic films with nano-scaled dots exhibit some special magnetic properties. In this paper, we investigate the in-plane shape anisotropy and the magnetization dynamic damping in permalloy (Ni80Fe20) arrays of submicron rectangular elements using ferromagnetic resonance (FMR). The FMR linewidth exhibits a dependence on the element size, and mainly comes from the contribution of the intrinsic damping. Also the contribution of two-magnon scattering plays an important role and is reduced with increasing aspect ratio. The damping coefficient decreases from 0.0129 to 0.0118 with the element length increasing from 300 nm to 1200 nm, and the theoretical calculation suggests that the change of damping results from the longitudinal and transverse interlayer spin current due to the spatially inhomogeneous magnetization dynamics.http://dx.doi.org/10.1063/1.4944768 |
| spellingShingle | D. Zhang J. J. Yue Z. X. Kou L. Lin Y. Zhai H. R. Zhai The investigation of ferromagnetic resonance linewidth in Ni80Fe20 films with submicron rectangular elements AIP Advances |
| title | The investigation of ferromagnetic resonance linewidth in Ni80Fe20 films with submicron rectangular elements |
| title_full | The investigation of ferromagnetic resonance linewidth in Ni80Fe20 films with submicron rectangular elements |
| title_fullStr | The investigation of ferromagnetic resonance linewidth in Ni80Fe20 films with submicron rectangular elements |
| title_full_unstemmed | The investigation of ferromagnetic resonance linewidth in Ni80Fe20 films with submicron rectangular elements |
| title_short | The investigation of ferromagnetic resonance linewidth in Ni80Fe20 films with submicron rectangular elements |
| title_sort | investigation of ferromagnetic resonance linewidth in ni80fe20 films with submicron rectangular elements |
| url | http://dx.doi.org/10.1063/1.4944768 |
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