Conductive-Atomic Force Microscopy Investigation of the Electrical Properties of Low Temperature Deposed ZnO Transparent Thin Films
The paper presents the investigation by conductive-atomic force microscopy (C-AFM) of the variation of the local conductivity and topography of the transparent ZnO thin films deposed onto soda lima glass substrates by spin-coating of pre-prepared ZnO nanoparticles. With conductivity measurements at...
| Main Authors: | , , , , , |
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| Format: | Article |
| Language: | English |
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Galati University Press
2015-06-01
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| Series: | The Annals of “Dunarea de Jos” University of Galati. Fascicle IX, Metallurgy and Materials Science |
| Subjects: | |
| Online Access: | https://www.gup.ugal.ro/ugaljournals/index.php/mms/article/view/1329 |
| _version_ | 1818790097842077696 |
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| author | A. ALEXA A. PIMENTEL T. CALMEIRO A. ISTRATE E. FORTUNATO V. MUȘAT |
| author_facet | A. ALEXA A. PIMENTEL T. CALMEIRO A. ISTRATE E. FORTUNATO V. MUȘAT |
| author_sort | A. ALEXA |
| collection | DOAJ |
| description | The paper presents the investigation by conductive-atomic force microscopy (C-AFM) of the variation of the local conductivity and topography of the transparent ZnO thin films deposed onto soda lima glass substrates by spin-coating of pre-prepared ZnO nanoparticles. With conductivity measurements at the nanometer level, the chemical and crystalline structure of the thin films obtained at temperature below 200 °C was investigated by Fourier transform infrared (FTIR) spectroscopy and X-ray diffraction, respectively, as a function of the number of the deposed layers and conditions of their deposition, such as deposition rate and the temperature of post-deposition annealing. The increase of the thermal treatment temperature, from 120 to 180 °C, leads to increased values of all thin films, most notably for the thickest sample with three layers deposed at 500 rpm that shows the highest decrease of thickness, indicating the highest compaction. The samples with three layers post-treated at 180 oC show grain growth associated with increased roughness. |
| first_indexed | 2024-12-18T14:50:03Z |
| format | Article |
| id | doaj.art-c66316f1d9fd4d29b851bc3dbd7a3f69 |
| institution | Directory Open Access Journal |
| issn | 2668-4748 2668-4756 |
| language | English |
| last_indexed | 2024-12-18T14:50:03Z |
| publishDate | 2015-06-01 |
| publisher | Galati University Press |
| record_format | Article |
| series | The Annals of “Dunarea de Jos” University of Galati. Fascicle IX, Metallurgy and Materials Science |
| spelling | doaj.art-c66316f1d9fd4d29b851bc3dbd7a3f692022-12-21T21:04:12ZengGalati University PressThe Annals of “Dunarea de Jos” University of Galati. Fascicle IX, Metallurgy and Materials Science2668-47482668-47562015-06-013821329Conductive-Atomic Force Microscopy Investigation of the Electrical Properties of Low Temperature Deposed ZnO Transparent Thin FilmsA. ALEXA0A. PIMENTEL1T. CALMEIRO2A. ISTRATE3E. FORTUNATO4V. MUȘAT5"Dunarea de Jos" University of GalatiUniversidade Nova de LisboaUniversidade Nova de LisboaNational Institute for R & D in Microtechnologies, BucharestUniversidade Nova de Lisboa"Dunarea de Jos" University of GalatiThe paper presents the investigation by conductive-atomic force microscopy (C-AFM) of the variation of the local conductivity and topography of the transparent ZnO thin films deposed onto soda lima glass substrates by spin-coating of pre-prepared ZnO nanoparticles. With conductivity measurements at the nanometer level, the chemical and crystalline structure of the thin films obtained at temperature below 200 °C was investigated by Fourier transform infrared (FTIR) spectroscopy and X-ray diffraction, respectively, as a function of the number of the deposed layers and conditions of their deposition, such as deposition rate and the temperature of post-deposition annealing. The increase of the thermal treatment temperature, from 120 to 180 °C, leads to increased values of all thin films, most notably for the thickest sample with three layers deposed at 500 rpm that shows the highest decrease of thickness, indicating the highest compaction. The samples with three layers post-treated at 180 oC show grain growth associated with increased roughness.https://www.gup.ugal.ro/ugaljournals/index.php/mms/article/view/1329ZnO nanoparticlestransparent thin filmsspin-coatingmicrostructureconductive atomic force microscopy |
| spellingShingle | A. ALEXA A. PIMENTEL T. CALMEIRO A. ISTRATE E. FORTUNATO V. MUȘAT Conductive-Atomic Force Microscopy Investigation of the Electrical Properties of Low Temperature Deposed ZnO Transparent Thin Films The Annals of “Dunarea de Jos” University of Galati. Fascicle IX, Metallurgy and Materials Science ZnO nanoparticles transparent thin films spin-coating microstructure conductive atomic force microscopy |
| title | Conductive-Atomic Force Microscopy Investigation of the Electrical Properties of Low Temperature Deposed ZnO Transparent Thin Films |
| title_full | Conductive-Atomic Force Microscopy Investigation of the Electrical Properties of Low Temperature Deposed ZnO Transparent Thin Films |
| title_fullStr | Conductive-Atomic Force Microscopy Investigation of the Electrical Properties of Low Temperature Deposed ZnO Transparent Thin Films |
| title_full_unstemmed | Conductive-Atomic Force Microscopy Investigation of the Electrical Properties of Low Temperature Deposed ZnO Transparent Thin Films |
| title_short | Conductive-Atomic Force Microscopy Investigation of the Electrical Properties of Low Temperature Deposed ZnO Transparent Thin Films |
| title_sort | conductive atomic force microscopy investigation of the electrical properties of low temperature deposed zno transparent thin films |
| topic | ZnO nanoparticles transparent thin films spin-coating microstructure conductive atomic force microscopy |
| url | https://www.gup.ugal.ro/ugaljournals/index.php/mms/article/view/1329 |
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