Phase Mapping Using a Combination of Multi-Functional Scanning Electron Microscopy Detectors and Imaging Modes

Phase Mapping Using a Combination of Multi-Functional Scanning Electron Microscopy Detectors and Imaging Modes

Microstructure degradation and phase transformations are critical concerns in nickel-based superalloys during thermal exposure. Understanding the phase transformation mechanism requires the detailed mapping of the distribution of each phase at different degradation stages and in various precipitatio...

Ful tanımlama

Detaylı Bibliyografya
Asıl Yazarlar: Gang Liu, Yonghua Zhao, Shuai Wang
Materyal Türü: Makale
Dil:English
Baskı/Yayın Bilgisi: MDPI AG 2024-08-01
Seri Bilgileri:Metals
Konular:
nickel-based superalloy
phase identification
η phase
MC-carbide
Online Erişim:https://www.mdpi.com/2075-4701/14/8/899

Internet

https://www.mdpi.com/2075-4701/14/8/899

Benzer Materyaller