Influence of Ink Properties on the Morphology of Long-Wave Infrared HgSe Quantum Dot Films

Influence of Ink Properties on the Morphology of Long-Wave Infrared HgSe Quantum Dot Films

As the core device of the miniature quantum dot (QD) spectrometer, the morphology control of the filter film array cannot be ignored. We eliminated strong interference from additives on the spectrum of a long-wave infrared (LWIR) QD filter film by selecting volatile additives. This work is significa...

Descripción completa

Detalles Bibliográficos
Autores principales: Suhui Wang, Xu Zhang, Yi Wang, Tengxiao Guo, Shuya Cao
Formato: Artículo
Lenguaje:English
Publicado: MDPI AG 2022-06-01
Colección:Nanomaterials
Materias:
HgSe QD
long-wave infrared
evaporated film
morphology
Acceso en línea:https://www.mdpi.com/2079-4991/12/13/2180

Ejemplares similares

Ejemplares similares