Spin-polarized scanning tunneling microscopy experiments on the rough surface of a polycrystalline NiFe film with a fine magnetic tip sensitive to a well-defined magnetization component
We developed a micrometer-sized magnetic tip integrated onto the write head of a hard disk drive for spin-polarized scanning tunneling microscopy (SP-STM) in the modulated tip magnetization mode. Using SP-STM, we measured a well-defined in-plane spin-component of the tunneling current of the rough s...
| Main Authors: | , , , , , , , |
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| Format: | Article |
| Language: | English |
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AIP Publishing LLC
2016-03-01
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| Series: | AIP Advances |
| Online Access: | http://dx.doi.org/10.1063/1.4944951 |
| _version_ | 1819092337119199232 |
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| author | H. Matsuyama D. Nara R. Kageyama K. Honda T. Sato K. Kusanagi E. Srinivasan K. Koike |
| author_facet | H. Matsuyama D. Nara R. Kageyama K. Honda T. Sato K. Kusanagi E. Srinivasan K. Koike |
| author_sort | H. Matsuyama |
| collection | DOAJ |
| description | We developed a micrometer-sized magnetic tip integrated onto the write head of a hard disk drive for spin-polarized scanning tunneling microscopy (SP-STM) in the modulated tip magnetization mode. Using SP-STM, we measured a well-defined in-plane spin-component of the tunneling current of the rough surface of a polycrystalline NiFe film. The spin asymmetry of the NiFe film was about 1.3% within the bias voltage range of -3 to 1 V. We obtained the local spin component image of the sample surface, switching the magnetic field of the sample to reverse the sample magnetization during scanning. We also obtained a spin image of the rough surface of a polycrystalline NiFe film evaporated on the recording medium of a hard disk drive. |
| first_indexed | 2024-12-21T22:54:01Z |
| format | Article |
| id | doaj.art-c760fe9ca3094ad1b3c16199bebe0a76 |
| institution | Directory Open Access Journal |
| issn | 2158-3226 |
| language | English |
| last_indexed | 2024-12-21T22:54:01Z |
| publishDate | 2016-03-01 |
| publisher | AIP Publishing LLC |
| record_format | Article |
| series | AIP Advances |
| spelling | doaj.art-c760fe9ca3094ad1b3c16199bebe0a762022-12-21T18:47:29ZengAIP Publishing LLCAIP Advances2158-32262016-03-0163035122035122-610.1063/1.4944951073603ADVSpin-polarized scanning tunneling microscopy experiments on the rough surface of a polycrystalline NiFe film with a fine magnetic tip sensitive to a well-defined magnetization componentH. Matsuyama0D. Nara1R. Kageyama2K. Honda3T. Sato4K. Kusanagi5E. Srinivasan6K. Koike7Department of Physics, Faculty of Science, Hokkaido University, Sapporo, Hokkaido 060-0810, JapanDepartment of Condensed Matter Physics, Graduate School of Science, Hokkaido University, Sapporo, Hokkaido 060-0810, JapanDepartment of Condensed Matter Physics, Graduate School of Science, Hokkaido University, Sapporo, Hokkaido 060-0810, JapanDepartment of Condensed Matter Physics, Graduate School of Science, Hokkaido University, Sapporo, Hokkaido 060-0810, JapanDepartment of Condensed Matter Physics, Graduate School of Science, Hokkaido University, Sapporo, Hokkaido 060-0810, JapanDepartment of Condensed Matter Physics, Graduate School of Science, Hokkaido University, Sapporo, Hokkaido 060-0810, JapanCreative Research Institution (CRIS), Hokkaido University, Sapporo, Hokkaido 001-0021, JapanDepartment of Physics, Faculty of Science, Hokkaido University, Sapporo, Hokkaido 060-0810, JapanWe developed a micrometer-sized magnetic tip integrated onto the write head of a hard disk drive for spin-polarized scanning tunneling microscopy (SP-STM) in the modulated tip magnetization mode. Using SP-STM, we measured a well-defined in-plane spin-component of the tunneling current of the rough surface of a polycrystalline NiFe film. The spin asymmetry of the NiFe film was about 1.3% within the bias voltage range of -3 to 1 V. We obtained the local spin component image of the sample surface, switching the magnetic field of the sample to reverse the sample magnetization during scanning. We also obtained a spin image of the rough surface of a polycrystalline NiFe film evaporated on the recording medium of a hard disk drive.http://dx.doi.org/10.1063/1.4944951 |
| spellingShingle | H. Matsuyama D. Nara R. Kageyama K. Honda T. Sato K. Kusanagi E. Srinivasan K. Koike Spin-polarized scanning tunneling microscopy experiments on the rough surface of a polycrystalline NiFe film with a fine magnetic tip sensitive to a well-defined magnetization component AIP Advances |
| title | Spin-polarized scanning tunneling microscopy experiments on the rough surface of a polycrystalline NiFe film with a fine magnetic tip sensitive to a well-defined magnetization component |
| title_full | Spin-polarized scanning tunneling microscopy experiments on the rough surface of a polycrystalline NiFe film with a fine magnetic tip sensitive to a well-defined magnetization component |
| title_fullStr | Spin-polarized scanning tunneling microscopy experiments on the rough surface of a polycrystalline NiFe film with a fine magnetic tip sensitive to a well-defined magnetization component |
| title_full_unstemmed | Spin-polarized scanning tunneling microscopy experiments on the rough surface of a polycrystalline NiFe film with a fine magnetic tip sensitive to a well-defined magnetization component |
| title_short | Spin-polarized scanning tunneling microscopy experiments on the rough surface of a polycrystalline NiFe film with a fine magnetic tip sensitive to a well-defined magnetization component |
| title_sort | spin polarized scanning tunneling microscopy experiments on the rough surface of a polycrystalline nife film with a fine magnetic tip sensitive to a well defined magnetization component |
| url | http://dx.doi.org/10.1063/1.4944951 |
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