True-remanent, resistive-leakage and mechanical studies of flux grown 0.64PMN-0.36PT single crystals

Ferroelectric single crystals of 0.64Pb(Mg1/3Nb2/3)O3-0.36PbTiO3 (PMN-PT), which have attracted lot of attention because of its excellent ferroelectric and piezoelectric response, has been successfully grown in the vicinity of morphotropic phase boundary, using high temperature solution method with...

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Main Authors: Abhilash J. Joseph, Nidhi Sinha, Sahil Goel, Abid Hussain, Binay Kumar
Format: Article
Language:English
Published: Elsevier 2020-01-01
Series:Arabian Journal of Chemistry
Online Access:http://www.sciencedirect.com/science/article/pii/S1878535218301394
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author Abhilash J. Joseph
Nidhi Sinha
Sahil Goel
Abid Hussain
Binay Kumar
author_facet Abhilash J. Joseph
Nidhi Sinha
Sahil Goel
Abid Hussain
Binay Kumar
author_sort Abhilash J. Joseph
collection DOAJ
description Ferroelectric single crystals of 0.64Pb(Mg1/3Nb2/3)O3-0.36PbTiO3 (PMN-PT), which have attracted lot of attention because of its excellent ferroelectric and piezoelectric response, has been successfully grown in the vicinity of morphotropic phase boundary, using high temperature solution method with PbO/B2O3 as flux. The crystals were characterized for its dielectric, ferroelectric, piezoelectric and pyroelectric properties along with the investigation of its domain structure. A high Curie temperature (Tc = 190 °C) was observed in the dielectric study. Well-saturated ferroelectric hysteresis loops with high remanent polarization, good switching and fatigue resistant nature indicated the high ferroelectric quality of the crystals. A high value of piezoelectric coefficient (d33∗ = 1398 pm/V) was obtained from the butterfly loops. True-remanent hysteresis study unveiled the practically usable polarization value, which actually serves as memory component in devices and has never been reported for PMN-PT crystals. Time-dependent compensated hysteresis analysis was carried out to study the resistive-leakage nature of the grown crystals which is also a new study for this system. Weibull statistics was used to analyze the distribution of hardness number and to find the values of critical load for the flux grown PMN-PT crystals which helps to critically analyze materials suitability for device fabrication. Keywords: PMN-PT, Flux growth, True-remanent polarization, Time-dependent compensated hysteresis, Piezoelectricity, Micro-hardness
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spelling doaj.art-c77ef542c9d7451da9c4d8a15ea4bc262022-12-22T00:00:33ZengElsevierArabian Journal of Chemistry1878-53522020-01-0113125962610True-remanent, resistive-leakage and mechanical studies of flux grown 0.64PMN-0.36PT single crystalsAbhilash J. Joseph0Nidhi Sinha1Sahil Goel2Abid Hussain3Binay Kumar4Crystal Lab, Department of Physics and Astrophysics, University of Delhi, Delhi 110007, IndiaDepartment of Electronics, SGTB Khalsa College, University of Delhi, Delhi 110007, IndiaCrystal Lab, Department of Physics and Astrophysics, University of Delhi, Delhi 110007, IndiaCrystal Lab, Department of Physics and Astrophysics, University of Delhi, Delhi 110007, IndiaCrystal Lab, Department of Physics and Astrophysics, University of Delhi, Delhi 110007, India; Corresponding author.Ferroelectric single crystals of 0.64Pb(Mg1/3Nb2/3)O3-0.36PbTiO3 (PMN-PT), which have attracted lot of attention because of its excellent ferroelectric and piezoelectric response, has been successfully grown in the vicinity of morphotropic phase boundary, using high temperature solution method with PbO/B2O3 as flux. The crystals were characterized for its dielectric, ferroelectric, piezoelectric and pyroelectric properties along with the investigation of its domain structure. A high Curie temperature (Tc = 190 °C) was observed in the dielectric study. Well-saturated ferroelectric hysteresis loops with high remanent polarization, good switching and fatigue resistant nature indicated the high ferroelectric quality of the crystals. A high value of piezoelectric coefficient (d33∗ = 1398 pm/V) was obtained from the butterfly loops. True-remanent hysteresis study unveiled the practically usable polarization value, which actually serves as memory component in devices and has never been reported for PMN-PT crystals. Time-dependent compensated hysteresis analysis was carried out to study the resistive-leakage nature of the grown crystals which is also a new study for this system. Weibull statistics was used to analyze the distribution of hardness number and to find the values of critical load for the flux grown PMN-PT crystals which helps to critically analyze materials suitability for device fabrication. Keywords: PMN-PT, Flux growth, True-remanent polarization, Time-dependent compensated hysteresis, Piezoelectricity, Micro-hardnesshttp://www.sciencedirect.com/science/article/pii/S1878535218301394
spellingShingle Abhilash J. Joseph
Nidhi Sinha
Sahil Goel
Abid Hussain
Binay Kumar
True-remanent, resistive-leakage and mechanical studies of flux grown 0.64PMN-0.36PT single crystals
Arabian Journal of Chemistry
title True-remanent, resistive-leakage and mechanical studies of flux grown 0.64PMN-0.36PT single crystals
title_full True-remanent, resistive-leakage and mechanical studies of flux grown 0.64PMN-0.36PT single crystals
title_fullStr True-remanent, resistive-leakage and mechanical studies of flux grown 0.64PMN-0.36PT single crystals
title_full_unstemmed True-remanent, resistive-leakage and mechanical studies of flux grown 0.64PMN-0.36PT single crystals
title_short True-remanent, resistive-leakage and mechanical studies of flux grown 0.64PMN-0.36PT single crystals
title_sort true remanent resistive leakage and mechanical studies of flux grown 0 64pmn 0 36pt single crystals
url http://www.sciencedirect.com/science/article/pii/S1878535218301394
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