Analysis of a mechanical structure of a microscope sensor of atomic force / Atominių jėgų mikroskopo jutiklio mechaninės struktūros analizė

Analysis of a mechanical structure of a microscope sensor of atomic force / Atominių jėgų mikroskopo jutiklio mechaninės struktūros analizė

Atomic Force Microscopy (AFM) is a method that allows obtaining an image of the surface of the sample in high resolution. This article investigates the problems associated with modeling a mechanical structure of a microscope sensor of atomic force.The paper refers to the previous scientists’ works a...

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Bibliographic Details
Main Authors: Andrius Dzedzickis, Vytautas Bučinskas
Format: Article
Language:English
Published: Vilnius Gediminas Technical University 2015-03-01
Series:Mokslas: Lietuvos Ateitis
Subjects:
atomic force microscopy
modeling
dynamic characteristics of the system
Online Access:http://journals.vgtu.lt/index.php/MLA/article/view/3620

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