Near-Infrared Triggered Degradation for Transient Electronics

Bibliographic Details
Main Authors:	Emin Istif, Mohsin Ali, Elif Yaren Ozuaciksoz, Yagız Morova, Levent Beker
Format:	Article
Language:	English
Published:	American Chemical Society 2024-01-01
Series:	ACS Omega
Online Access:	https://doi.org/10.1021/acsomega.3c07203

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